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Paul Tracy
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Sunnyvale, CA, US
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last 30 patents
Information
Patent Grant
Automatic test configuration generation facilitating repair of prog...
Patent number
7,409,669
Issue date
Aug 5, 2008
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING
Information
Patent Grant
Method of maintaining signal integrity across a capacitive coupled...
Patent number
7,319,341
Issue date
Jan 15, 2008
Altera Corporation
Michael Harms
G01 - MEASURING TESTING
Information
Patent Grant
Feature control circuitry for testing integrated circuits
Patent number
7,301,836
Issue date
Nov 27, 2007
Altera Corporation
Dhananjay Srinivasa Raghavan
G01 - MEASURING TESTING
Information
Patent Grant
System for loading configuration data into a configuration word reg...
Patent number
7,237,106
Issue date
Jun 26, 2007
Altera Corporation
Paul Tracy
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for testing interconnect bridging faults in an...
Patent number
7,103,813
Issue date
Sep 5, 2006
Altera Corporation
Paul Tracy
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for application specific test of PLDs
Patent number
7,058,534
Issue date
Jun 6, 2006
Altera Corporation
Paul Tracy
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for automatically generating tests for programmable circ...
Patent number
7,024,327
Issue date
Apr 4, 2006
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING
Information
Patent Grant
Built-in self-test circuitry for integrated circuits
Patent number
7,005,875
Issue date
Feb 28, 2006
Altera Corporation
Balaji Natarajan
G01 - MEASURING TESTING