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Paul Trudeau
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Mountain View, CA, US
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last 30 patents
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Patent Grant
System for testing DUT and tester for use therewith
Patent number
7,385,385
Issue date
Jun 10, 2008
Nextest Systems Corporation
Paul Magliocco
G01 - MEASURING TESTING
Information
Patent Grant
Portable manipulator for stackable semiconductor test system
Patent number
7,312,604
Issue date
Dec 25, 2007
Nextest Systems Corporation
Paul Trudeau
G01 - MEASURING TESTING
Information
Patent Grant
Integrated test cell
Patent number
6,310,486
Issue date
Oct 30, 2001
Teradyne, Inc.
David Trevisan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PORTABLE MANIPULATOR FOR STACKABLE SEMICONDUCTOR TEST SYSTEM
Publication number
20080100322
Publication date
May 1, 2008
Nextest Systems Corporation
Paul Trudeau
G01 - MEASURING TESTING
Information
Patent Application
Portable manipulator for stackable semiconductor test system
Publication number
20070024296
Publication date
Feb 1, 2007
Nextest Systems Corporation
Paul Trudeau
G01 - MEASURING TESTING
Information
Patent Application
Stackable semiconductor test system and method for operating same
Publication number
20030062888
Publication date
Apr 3, 2003
Paul Magliocco
G01 - MEASURING TESTING