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Paul Van Riel
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Rotterdam, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Method and device for the generation and application of anisotropic...
Patent number
6,901,333
Issue date
May 31, 2005
Fugro N.V.
Paul Van Riel
G01 - MEASURING TESTING
Information
Patent Grant
Method of estimating elastic and compositional parameters from seis...
Patent number
6,876,928
Issue date
Apr 5, 2005
Jason Geosystems B.V.
Paul Van Riel
G01 - MEASURING TESTING
Information
Patent Grant
Method of estimating elastic and compositional parameters from seis...
Patent number
6,665,615
Issue date
Dec 16, 2003
Jason Geosystems B.V.
Paul Van Riel
G01 - MEASURING TESTING
Information
Patent Grant
Method of joint analysis and interpretation of the subsurface from...
Patent number
6,618,678
Issue date
Sep 9, 2003
Jason Geosystems B.V.
Paul Van Riel
G01 - MEASURING TESTING
Information
Patent Grant
Method of determining spatial changes in subsurface structure, stra...
Patent number
6,401,042
Issue date
Jun 4, 2002
Jason Geosystems B.V.
Paul Van Riel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND DEVICE FOR THE GENERATION AND APPLICATION OF ANISOTROPIC...
Publication number
20050090986
Publication date
Apr 28, 2005
Fugro-Jason
Paul Van Riel
G01 - MEASURING TESTING
Information
Patent Application
Method of estimating elastic and compositional parameters from seis...
Publication number
20040064294
Publication date
Apr 1, 2004
Jason Geosystems B.V.
Paul Van Riel
G01 - MEASURING TESTING
Information
Patent Application
Method of estimating elastic and compositional parameters from seis...
Publication number
20020013661
Publication date
Jan 31, 2002
Jason Geosystems B.V.
Paul Van Riel
G01 - MEASURING TESTING