Paul Willard ACKMANN

Person

Lakeway, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Grid-based fragmentation for optical proximity correction in photol...
- Patent number 8,010,915
- Issue date Aug 30, 2011
- GLOBALFOUNDRIES, INC.
- Norman Shaowen Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for programmed latency for improving wafer-to-...
- Patent number 6,405,144
- Issue date Jun 11, 2002
- Advanced Micro Devices, Inc.
- Anthony J. Toprac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing the susceptibility to chemical-mechanical polis...
- Patent number 6,271,602
- Issue date Aug 7, 2001
- Advanced Micro Devices, Inc.
- Paul W. Ackmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mark protection with transparent film
- Patent number 6,207,966
- Issue date Mar 27, 2001
- Advanced Micro Devices, Inc.
- Khanh B. Nguyen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Removal of reticle effect on critical dimension by reticle rotation
- Patent number 6,178,256
- Issue date Jan 23, 2001
- Advanced Micro Devices, Inc.
- Khanh B. Nguyen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automated data management system for analysis and control of photol...
- Patent number 5,757,673
- Issue date May 26, 1998
- Advanced Micro Devices, Inc.
- Anastasia L. Osheiski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated data management system for analysis and control of photol...
- Patent number 5,586,059
- Issue date Dec 17, 1996
- Advanced Micro Devices, Inc.
- Anastasia L. Oshelski
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
GRID-BASED FRAGMENTATION FOR OPTICAL PROXIMITY CORRECTION IN PHOTOL...
- Publication number 20100011335
- Publication date Jan 14, 2010
- Advanced Micro Devices, Inc.
- Norman Shaowen CHEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Paul Willard ACKMANN

Person

Patents Grantslast 30 patents

Grid-based fragmentation for optical proximity correction in photol...

Method and apparatus for programmed latency for improving wafer-to-...

Method for reducing the susceptibility to chemical-mechanical polis...

Mark protection with transparent film

Removal of reticle effect on critical dimension by reticle rotation

Automated data management system for analysis and control of photol...

Automated data management system for analysis and control of photol...

Patents Applicationslast 30 patents

GRID-BASED FRAGMENTATION FOR OPTICAL PROXIMITY CORRECTION IN PHOTOL...