Paul William Rutkowski

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Bridgewater, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test hierarchy for an integrated circuit
- Patent number 7,005,873
- Issue date Feb 28, 2006
- Agere Systems Inc.
- Llyoung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test controlled by a token network and method
- Patent number 6,237,123
- Issue date May 22, 2001
- Lucent Technologies Inc.
- Ilyoung Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test in a plurality of stages controlled by a token p...
- Patent number 5,978,947
- Issue date Nov 2, 1999
- Lucent Technologies Inc.
- Ilyoung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for partial-scan testing of a device using its...
- Patent number 5,623,503
- Issue date Apr 22, 1997
- Lucent Technologies Inc.
- Paul W. Rutkowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Enhanced boundary-scan method and apparatus providing tester channe...
- Publication number 20040199838
- Publication date Oct 7, 2004
- Paul William Rutkowski
- G01 - MEASURING TESTING
Information Patent Application
Built-in self-test hierarchy for an integrated circuit
- Publication number 20040128600
- Publication date Jul 1, 2004
- Ilyoung Kim
- G01 - MEASURING TESTING