Paulus Antonius Andreas Teunissen

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacture of a capillary for a hollow-core photonic cry...
- Patent number 12,130,468
- Issue date Oct 29, 2024
- ASML Netherlands B.V.
- Hendrik Sabert
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Mode control of photonic crystal fiber based broadband radiation so...
- Patent number 11,687,009
- Issue date Jun 27, 2023
- ASML NETHERLANDS B.V.
- Sebastian Thomas Bauerschmidt
- G02 - OPTICS
Information Patent Grant
Mode control of photonic crystal fiber based broadband radiation so...
- Patent number 11,360,396
- Issue date Jun 14, 2022
- ASML Netherlands B.V.
- Sebastian Thomas Bauerschmidt
- G02 - OPTICS
Information Patent Grant
Method of manufacture of a capillary for a hollow-core photonic cry...
- Patent number 11,333,825
- Issue date May 17, 2022
- ASML Netherlands B.V.
- Hendrik Sabert
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Topography measurement system
- Patent number 11,327,412
- Issue date May 10, 2022
- ASML Netherlands B.V.
- Ronald Franciscus Herman Hugers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wavelength combining of multiple source
- Patent number 10,520,824
- Issue date Dec 31, 2019
- ASML Netherlands B.V.
- Ronald Franciscus Herman Hugers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Topography measurement system
- Patent number 10,394,143
- Issue date Aug 27, 2019
- ASML Netherlands B.V.
- Nitesh Pandey
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and lithographic apparatus for measuring and acquiring heigh...
- Patent number 8,582,082
- Issue date Nov 12, 2013
- ASML Netherlands B.V.
- Frank Staals
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUSES FOR SPATIALLY FILTERING OPTICAL PULSES
- Publication number 20240134182
- Publication date Apr 25, 2024
- ASML NETHERLANDS B.V.
- Ali ALSAQQA
- G02 - OPTICS
Information Patent Application
RADIATION SOURCE ARRANGEMENT AND METROLOGY DEVICE
- Publication number 20240004308
- Publication date Jan 4, 2024
- ASML NETHERLANDS B.V.
- Ali ALSAQQA
- G02 - OPTICS
Information Patent Application
MODE CONTROL OF PHOTONIC CRYSTAL FIBER BASED BROADBAND RADIATION SO...
- Publication number 20230280660
- Publication date Sep 7, 2023
- ASML NETHERLANDS B.V.
- Sebastian Thomas Bauerschmidt
- G01 - MEASURING TESTING
Information Patent Application
MODE CONTROL OF PHOTONIC CRYSTAL FIBER BASED BROADBAND RADIATION SO...
- Publication number 20220269183
- Publication date Aug 25, 2022
- ASML NETHERLANDS B.V.
- Sebastian Thomas Bauerschmidt
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURE OF A CAPILLARY FOR A HOLLOW-CORE PHOTONIC CRY...
- Publication number 20220236479
- Publication date Jul 28, 2022
- ASML NETHERLANDS B.V.
- Hendrik Sabert
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
METHOD OF MANUFACTURE OF A CAPILLARY FOR A HOLLOW-CORE PHOTONIC CRY...
- Publication number 20210141150
- Publication date May 13, 2021
- ASML NETHERLANDS B.V.
- Hendrik SABERT
- G02 - OPTICS
Information Patent Application
MODE CONTROL OF PHOTONIC CRYSTAL FIBER BASED BROADBAND RADIATION SO...
- Publication number 20210063894
- Publication date Mar 4, 2021
- ASML NETHERLANDS B.V.
- Sebastian Thomas BAUERSCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH COMBINING OF MULTIPLE SOURCE
- Publication number 20190049864
- Publication date Feb 14, 2019
- ASML NETHERLANDS B.V.
- Ronald Franciscus Herman HUGERS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TOPOGRAPHY MEASUREMENT SYSTEM
- Publication number 20180373171
- Publication date Dec 27, 2018
- ASML NETHERLANDS B.V.
- Ronald Franciscus Herman HUGERS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Topography Measurement System
- Publication number 20180267415
- Publication date Sep 20, 2018
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Level sensor for lithographic apparatus
- Publication number 20050274909
- Publication date Dec 15, 2005
- ASML NETHERLANDS B.V.
- Paulus Antonius Andreas Teunissen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic apparatus, level sensor, method of inspection, device...
- Publication number 20040165169
- Publication date Aug 26, 2004
- ASML NETHERLANDS B.V.
- Paulus Antonius Andreas Teunissen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic apparatus, device manufacturing method, and device man...
- Publication number 20030218141
- Publication date Nov 27, 2003
- ASML NETHERLANDS, B.V.
- Rene Marinus Gerardus Johan Queens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Paulus Antonius Andreas Teunissen

Person

Patents Grantslast 30 patents

Method of manufacture of a capillary for a hollow-core photonic cry...

Mode control of photonic crystal fiber based broadband radiation so...

Mode control of photonic crystal fiber based broadband radiation so...

Method of manufacture of a capillary for a hollow-core photonic cry...

Topography measurement system

Wavelength combining of multiple source

Topography measurement system

Method and lithographic apparatus for measuring and acquiring heigh...

Patents Applicationslast 30 patents

METHODS AND APPARATUSES FOR SPATIALLY FILTERING OPTICAL PULSES

RADIATION SOURCE ARRANGEMENT AND METROLOGY DEVICE

MODE CONTROL OF PHOTONIC CRYSTAL FIBER BASED BROADBAND RADIATION SO...

MODE CONTROL OF PHOTONIC CRYSTAL FIBER BASED BROADBAND RADIATION SO...

METHOD OF MANUFACTURE OF A CAPILLARY FOR A HOLLOW-CORE PHOTONIC CRY...

METHOD OF MANUFACTURE OF A CAPILLARY FOR A HOLLOW-CORE PHOTONIC CRY...

MODE CONTROL OF PHOTONIC CRYSTAL FIBER BASED BROADBAND RADIATION SO...

WAVELENGTH COMBINING OF MULTIPLE SOURCE

TOPOGRAPHY MEASUREMENT SYSTEM

Topography Measurement System

Level sensor for lithographic apparatus

Lithographic apparatus, level sensor, method of inspection, device...

Lithographic apparatus, device manufacturing method, and device man...