Paulus Clemens Maria PLANKEN

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Jaarsveld, NL

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Patents Grantslast 30 patents

Information Patent Grant
Alignment measurement system
- Patent number 11,042,096
- Issue date Jun 22, 2021
- ASML Netherlands B.V.
- Stefan Michiel Witte
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for measuring a structure on a substrate
- Patent number 10,788,765
- Issue date Sep 29, 2020
- ASML Netherlands B.V.
- Stefan Michiel Witte
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY METHOD AND APPARATUS
- Publication number 20240184222
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Guido DE HAAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment Measurement System
- Publication number 20200142319
- Publication date May 7, 2020
- ASML Netherlands B.V.
- Stefan Michiel WITTE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR MEASURING A STRUCTURE ON A SUBSTRATE
- Publication number 20190354026
- Publication date Nov 21, 2019
- ASML NETHERLANDS B.V.
- Stefan Michiel WITTE
- G01 - MEASURING TESTING