Paulus J.M. van Adrichem

Person

Wijchen, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Determining subset of components of an optical characteristic of pa...
- Patent number 11,561,478
- Issue date Jan 24, 2023
- ASML Netherlands B.V.
- Johannes Jacobus Matheus Baselmans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Patterning process improvement involving optical aberration
- Patent number 11,422,472
- Issue date Aug 23, 2022
- ASML Netherlands B.V.
- Paulus Jacobus Maria Van Adrichem
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology apparatus and method for determining a characteristic rel...
- Patent number 11,385,554
- Issue date Jul 12, 2022
- ASML Netherlands B.V.
- Miguel Garcia Granda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimization of a lithography apparatus or patterning process based...
- Patent number 11,029,594
- Issue date Jun 8, 2021
- ASML Netherlands B.V.
- Steven George Hansen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithographic method and apparatus
- Patent number 10,175,586
- Issue date Jan 8, 2019
- ASML Netherlands B.V.
- Jaqueline Borges Nicolau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling for wafer stage vibration
- Patent number 9,835,959
- Issue date Dec 5, 2017
- Cymer, LLC
- Willard Earl Conley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic method and apparatus
- Patent number 9,817,320
- Issue date Nov 14, 2017
- ASML Netherlands B.V.
- Jaqueline Borges Nicolau
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining the effect of process variations
- Patent number 7,966,583
- Issue date Jun 21, 2011
- Synopsys, Inc.
- Paulus J. M. Van Adrichem
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for performing dummy-fill by using a set of du...
- Patent number 7,681,166
- Issue date Mar 16, 2010
- Synopsys, Inc.
- Paulus J. M. van Adrichem
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING SUBSET OF COMPONENTS OF AN OPTICAL CHARACTERISTIC OF PA...
- Publication number 20220082943
- Publication date Mar 17, 2022
- ASML NETHERLANDS B.V.
- Johannes Jacobus Matheus BASELMANS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERNING PROCESS IMPROVEMENT INVOLVING OPTICAL ABERRATION
- Publication number 20210165332
- Publication date Jun 3, 2021
- ASML NETHERLANDS B.V.
- Paulus Jacobus Maria VAN ADRICHEM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic Rel...
- Publication number 20200026182
- Publication date Jan 23, 2020
- ASML NETHERLANDS B.V.
- Miguel GARCIA GRANDA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTIMIZATION OF A LITHOGRAPHY APPARATUS OR PATTERNING PROCESS BASED...
- Publication number 20190369480
- Publication date Dec 5, 2019
- ASML NETHERLANDS B.V.
- Steven George HANSEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lithographic Method and Apparatus
- Publication number 20180039180
- Publication date Feb 8, 2018
- ASML NETHERLANDS B.V.
- Jaqueline BORGES NICOLAU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lithographic Method and Apparatus
- Publication number 20160274462
- Publication date Sep 22, 2016
- ASML NETHERLANDS B.V.
- Jaqueline BORGES NICOLAU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING THE EFFECT OF PROCESS VARIATIONS
- Publication number 20100011325
- Publication date Jan 14, 2010
- Synopsys, Inc.
- Paulus J.M. Van Adrichem
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING DUMMY-FILL BY USING A SET OF DU...
- Publication number 20090089732
- Publication date Apr 2, 2009
- Synopsys, Inc.
- Paulus J.M. van Adrichem
- G06 - COMPUTING CALCULATING COUNTING

Paulus J.M. van Adrichem

Person

Patents Grantslast 30 patents

Determining subset of components of an optical characteristic of pa...

Patterning process improvement involving optical aberration

Metrology apparatus and method for determining a characteristic rel...

Optimization of a lithography apparatus or patterning process based...

Lithographic method and apparatus

Controlling for wafer stage vibration

Lithographic method and apparatus

Method and apparatus for determining the effect of process variations

Method and apparatus for performing dummy-fill by using a set of du...

Patents Applicationslast 30 patents

DETERMINING SUBSET OF COMPONENTS OF AN OPTICAL CHARACTERISTIC OF PA...

PATTERNING PROCESS IMPROVEMENT INVOLVING OPTICAL ABERRATION

Metrology Apparatus and Method for Determining a Characteristic Rel...

OPTIMIZATION OF A LITHOGRAPHY APPARATUS OR PATTERNING PROCESS BASED...

Lithographic Method and Apparatus

Lithographic Method and Apparatus

METHOD AND APPARATUS FOR DETERMINING THE EFFECT OF PROCESS VARIATIONS

METHOD AND APPARATUS FOR PERFORMING DUMMY-FILL BY USING A SET OF DU...