Pavan Kumar

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection using difference images
- Patent number 11,270,430
- Issue date Mar 8, 2022
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for aligning semiconductor device reference image...
- Patent number 10,572,991
- Issue date Feb 25, 2020
- KLA-Tencor Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sub-pixel alignment of inspection to design
- Patent number 9,996,942
- Issue date Jun 12, 2018
- KLA-Tencor Corp.
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Aligning Semiconductor Device Reference Image...
- Publication number 20190139208
- Publication date May 9, 2019
- KLA-Tencor Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION USING DIFFERENCE IMAGES
- Publication number 20180342051
- Publication date Nov 29, 2018
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sub-Pixel Alignment of Inspection to Design
- Publication number 20160275672
- Publication date Sep 22, 2016
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING