Pavan Samudrala

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White Plains, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
High performance compliant wafer test probe
- Patent number 9,335,346
- Issue date May 10, 2016
- GLOBALFOUNDRIES Inc.
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Grant
High performance compliant wafer test probe
- Patent number 8,487,304
- Issue date Jul 16, 2013
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Performance Compliant Wafer Test Probe
- Publication number 20120329295
- Publication date Dec 27, 2012
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING
Information Patent Application
High Performance Compliant Wafer Test Probe
- Publication number 20110266539
- Publication date Nov 3, 2011
- International Business Machines Corporation
- S. Jay Chey
- G01 - MEASURING TESTING