Pavel Kolchin

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional imaging for semiconductor wafer inspection
- Patent number 10,887,580
- Issue date Jan 5, 2021
- KLA-Tencor Corporation
- Pavel Kolchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining information for defects on wafers
- Patent number 10,571,407
- Issue date Feb 25, 2020
- KLA-Tencor Corp.
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Grant
Determining information for defects on wafers
- Patent number 10,317,347
- Issue date Jun 11, 2019
- KLA-Tencor Corp.
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Grant
Determining a configuration for an optical element positioned in a...
- Patent number 10,215,713
- Issue date Feb 26, 2019
- KLA-Tencor Corp.
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for finding a best aperture and mode to enhan...
- Patent number 10,132,760
- Issue date Nov 20, 2018
- KLA-Tencor Corporation
- Pavel Kolchin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method to determine depth for optical wafer inspection
- Patent number 9,989,479
- Issue date Jun 5, 2018
- KLA-Tencor Corporation
- Pavel Kolchin
- G02 - OPTICS
Information Patent Grant
System and method for enhanced defect detection with a digital matc...
- Patent number 9,734,422
- Issue date Aug 15, 2017
- KLA-Tencor Corporation
- Pavel Kolchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for finding a best aperture and mode to enhan...
- Patent number 9,726,617
- Issue date Aug 8, 2017
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Grant
Determining a configuration for an optical element positioned in a...
- Patent number 9,709,510
- Issue date Jul 18, 2017
- KLA-Tencor Corp.
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Grant
System and method to determine depth for optical wafer inspection
- Patent number 9,389,349
- Issue date Jul 12, 2016
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Determining Information for Defects on Wafers
- Publication number 20190257768
- Publication date Aug 22, 2019
- KLA-Tencor Corporation
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Imaging For Semiconductor Wafer Inspection
- Publication number 20180103247
- Publication date Apr 12, 2018
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR FINDING A BEST APERTURE AND MODE TO ENHAN...
- Publication number 20170307545
- Publication date Oct 26, 2017
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Application
Determining a Configuration for an Optical Element Positioned in a...
- Publication number 20170292918
- Publication date Oct 12, 2017
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Enhanced Defect Detection with a Digital Matc...
- Publication number 20160140412
- Publication date May 19, 2016
- KLA-Tencor Corporation
- Pavel Kolchin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining a Configuration for an Optical Element Positioned in a...
- Publication number 20150377797
- Publication date Dec 31, 2015
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Application
Determining Information for Defects on Wafers
- Publication number 20150123014
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR FINDING A BEST APERTURE AND MODE TO ENHAN...
- Publication number 20140354983
- Publication date Dec 4, 2014
- KLA-Tencor Corporation
- Pavel Kolchin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO DETERMINE DEPTH FOR OPTICAL WAFER INSPECTION
- Publication number 20140268117
- Publication date Sep 18, 2014
- Pavel Kolchin
- G02 - OPTICS

Pavel Kolchin

Person

Patents Grantslast 30 patents

Three-dimensional imaging for semiconductor wafer inspection

Determining information for defects on wafers

Determining information for defects on wafers

Determining a configuration for an optical element positioned in a...

Apparatus and methods for finding a best aperture and mode to enhan...

System and method to determine depth for optical wafer inspection

System and method for enhanced defect detection with a digital matc...

Apparatus and methods for finding a best aperture and mode to enhan...

Determining a configuration for an optical element positioned in a...

System and method to determine depth for optical wafer inspection

Patents Applicationslast 30 patents

Determining Information for Defects on Wafers

Three-Dimensional Imaging For Semiconductor Wafer Inspection

APPARATUS AND METHODS FOR FINDING A BEST APERTURE AND MODE TO ENHAN...

Determining a Configuration for an Optical Element Positioned in a...

System and Method for Enhanced Defect Detection with a Digital Matc...

Determining a Configuration for an Optical Element Positioned in a...

Determining Information for Defects on Wafers

APPARATUS AND METHODS FOR FINDING A BEST APERTURE AND MODE TO ENHAN...

SYSTEM AND METHOD TO DETERMINE DEPTH FOR OPTICAL WAFER INSPECTION