Pavel Potocek

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method implemented by a data processing apparatus, and charged part...
- Patent number 12,175,648
- Issue date Dec 24, 2024
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Training an artificial neural network using simulated specimen images
- Patent number 12,002,194
- Issue date Jun 4, 2024
- FEI Company
- OndOnd{hacek over (r)}ej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive specimen image acquisition
- Patent number 11,982,634
- Issue date May 14, 2024
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Grant
Method implemented by a data processing apparatus, and charged part...
- Patent number 11,861,817
- Issue date Jan 2, 2024
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle microscope scan masking for three-dimensional reco...
- Patent number 11,741,730
- Issue date Aug 29, 2023
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 11,488,800
- Issue date Nov 1, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for remote deep learning for microscopic...
- Patent number 11,482,400
- Issue date Oct 25, 2022
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Depth reconstruction for 3D images of samples in a charged particle...
- Patent number 11,380,529
- Issue date Jul 5, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low keV ion beam image restoration by machine learning for object l...
- Patent number 11,355,305
- Issue date Jun 7, 2022
- FEI Company
- Remco Johannes Petrus Geurts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Slice depth reconstruction of charged particle images using model s...
- Patent number 11,282,670
- Issue date Mar 22, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Acquisition strategy for neural network based image restoration
- Patent number 11,100,612
- Issue date Aug 24, 2021
- FEI Company
- Maurice Peemen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 10,928,335
- Issue date Feb 23, 2021
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Grant
Method, device and system for remote deep learning for microscopic...
- Patent number 10,903,043
- Issue date Jan 26, 2021
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Training an artificial neural network using simulated specimen images
- Patent number 10,846,845
- Issue date Nov 24, 2020
- FEI Company
- OndOnd{hacek over (r)}ej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of analyzing surface modification of a specimen in a charged...
- Patent number 10,811,223
- Issue date Oct 20, 2020
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge reduction by digital image correlation
- Patent number 10,614,998
- Issue date Apr 7, 2020
- FEI Company
- Remco Geurts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tomographic imaging method
- Patent number 10,593,068
- Issue date Mar 17, 2020
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interactive graphical representation of image quality and control t...
- Patent number 10,481,378
- Issue date Nov 19, 2019
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional imaging in charged-particle microscopy
- Patent number 10,128,080
- Issue date Nov 13, 2018
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing surface modification of a specimen in a charged...
- Patent number 10,115,561
- Issue date Oct 30, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite scan path in a charged particle microscope
- Patent number 10,002,742
- Issue date Jun 19, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope with special aperture plate
- Patent number 9,934,936
- Issue date Apr 3, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of sampling a sample and displaying obtained information
- Patent number 9,762,863
- Issue date Sep 12, 2017
- FEI Company
- Pavel Potocek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged-particle microscope providing depth-resolved imagery
- Patent number 9,711,325
- Issue date Jul 18, 2017
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mathematical image assembly in a scanning-type microscope
- Patent number 9,620,330
- Issue date Apr 11, 2017
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Grant
Computational scanning microscopy with improved resolution
- Patent number 9,478,393
- Issue date Oct 25, 2016
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Grant
Charged particle microscope providing depth-resolved imagery
- Patent number 8,704,176
- Issue date Apr 22, 2014
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle microscope providing depth-resolved imagery
- Patent number 8,586,921
- Issue date Nov 19, 2013
- FEI Company
- Faysal Boughorbel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
- Publication number 20240094151
- Publication date Mar 21, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...
- Publication number 20240095897
- Publication date Mar 21, 2024
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Application Management For Charged Particle Microscope Devices
- Publication number 20240071717
- Publication date Feb 29, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
- Publication number 20230395351
- Publication date Dec 7, 2023
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20230035267
- Publication date Feb 2, 2023
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE SCAN MASKING FOR THREE-DIMENSIONAL RECO...
- Publication number 20220414361
- Publication date Dec 29, 2022
- FEI Company
- Pavel POTOCEK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPARSE IMAGE RECONSTRUCTION FROM NEIGHBORING TOMOGRAPHY TILT IMAGES
- Publication number 20220373481
- Publication date Nov 24, 2022
- FEI Company
- Maurice Peemen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...
- Publication number 20220310353
- Publication date Sep 29, 2022
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPTH RECONSTRUCTION FOR 3D IMAGES OF SAMPLES IN A CHARGED PARTICLE...
- Publication number 20220102121
- Publication date Mar 31, 2022
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...
- Publication number 20210327677
- Publication date Oct 21, 2021
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, device and system for remote deep learning for microscopic...
- Publication number 20210151289
- Publication date May 20, 2021
- FEI Company
- Remco SCHOENMAKERS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
- Publication number 20210131984
- Publication date May 6, 2021
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW KEV ION BEAM IMAGE RESTORATION BY MACHINE LEARNING FOR OBJECT L...
- Publication number 20210104375
- Publication date Apr 8, 2021
- FEI Company
- Remco Johannes Petrus Geurts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES
- Publication number 20210049749
- Publication date Feb 18, 2021
- FEI Company
- Ondrej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACQUISITION STRATEGY FOR NEURAL NETWORK BASED IMAGE RESTORATION
- Publication number 20200357097
- Publication date Nov 12, 2020
- FEI Company
- Maurice Peemen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFICIAL INTELLIGENCE ENABLED VOLUME RECONSTRUCTION
- Publication number 20200312611
- Publication date Oct 1, 2020
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECT TRACKING USING IMAGE SEGMENTATION
- Publication number 20200111219
- Publication date Apr 9, 2020
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES
- Publication number 20200034956
- Publication date Jan 30, 2020
- FEI Company
- Ondrej Machek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
- Publication number 20200025696
- Publication date Jan 23, 2020
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Application
CHARGE REDUCTION BY DIGITAL IMAGE CORRELATION
- Publication number 20190348256
- Publication date Nov 14, 2019
- FEI Company
- Remco Geurts
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, device and system for remote deep learning for microscopic...
- Publication number 20190287761
- Publication date Sep 19, 2019
- FEI Company
- Remco SCHOENMAKERS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...
- Publication number 20190051492
- Publication date Feb 14, 2019
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHIC IMAGING METHOD
- Publication number 20180082444
- Publication date Mar 22, 2018
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL IMAGING IN CHARGED-PARTICLE MICROSCOPY
- Publication number 20170309448
- Publication date Oct 26, 2017
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...
- Publication number 20160365224
- Publication date Dec 15, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE SCAN PATH IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160118219
- Publication date Apr 28, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH SPECIAL APERTURE PLATE
- Publication number 20160111247
- Publication date Apr 21, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION
- Publication number 20160013015
- Publication date Jan 14, 2016
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Application
MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE
- Publication number 20150371815
- Publication date Dec 24, 2015
- FEI Company
- Pavel Potocek
- G02 - OPTICS

Pavel Potocek

Person

Patents Grantslast 30 patents

Method implemented by a data processing apparatus, and charged part...

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Adaptive specimen image acquisition using an artificial neural network

Training an artificial neural network using simulated specimen images

Adaptive specimen image acquisition

Method implemented by a data processing apparatus, and charged part...

Charged particle microscope scan masking for three-dimensional reco...

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Method, device and system for remote deep learning for microscopic...

Depth reconstruction for 3D images of samples in a charged particle...

Low keV ion beam image restoration by machine learning for object l...

Slice depth reconstruction of charged particle images using model s...

Acquisition strategy for neural network based image restoration

Adaptive specimen image acquisition using an artificial neural network

Method, device and system for remote deep learning for microscopic...

Training an artificial neural network using simulated specimen images

Method of analyzing surface modification of a specimen in a charged...

Charge reduction by digital image correlation

Tomographic imaging method

Interactive graphical representation of image quality and control t...

Three-dimensional imaging in charged-particle microscopy

Method of analyzing surface modification of a specimen in a charged...

Composite scan path in a charged particle microscope

Charged particle microscope with special aperture plate

Method of sampling a sample and displaying obtained information

Charged-particle microscope providing depth-resolved imagery

Mathematical image assembly in a scanning-type microscope

Computational scanning microscopy with improved resolution

Charged particle microscope providing depth-resolved imagery

Charged-particle microscope providing depth-resolved imagery

Patents Applicationslast 30 patents

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK

METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...

Application Management For Charged Particle Microscope Devices

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

CHARGED PARTICLE MICROSCOPE SCAN MASKING FOR THREE-DIMENSIONAL RECO...

SPARSE IMAGE RECONSTRUCTION FROM NEIGHBORING TOMOGRAPHY TILT IMAGES

DUAL SPEED ACQUISITION FOR DRIFT CORRECTED, FAST, LOW DOSE, ADAPTIV...

DEPTH RECONSTRUCTION FOR 3D IMAGES OF SAMPLES IN A CHARGED PARTICLE...

METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...

Method, device and system for remote deep learning for microscopic...

ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK

LOW KEV ION BEAM IMAGE RESTORATION BY MACHINE LEARNING FOR OBJECT L...

TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES

ACQUISITION STRATEGY FOR NEURAL NETWORK BASED IMAGE RESTORATION

ARTIFICIAL INTELLIGENCE ENABLED VOLUME RECONSTRUCTION

OBJECT TRACKING USING IMAGE SEGMENTATION

TRAINING AN ARTIFICIAL NEURAL NETWORK USING SIMULATED SPECIMEN IMAGES

ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK

CHARGE REDUCTION BY DIGITAL IMAGE CORRELATION

Method, device and system for remote deep learning for microscopic...

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...

TOMOGRAPHIC IMAGING METHOD

THREE-DIMENSIONAL IMAGING IN CHARGED-PARTICLE MICROSCOPY

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...

COMPOSITE SCAN PATH IN A CHARGED PARTICLE MICROSCOPE

CHARGED PARTICLE MICROSCOPE WITH SPECIAL APERTURE PLATE

COMPUTATIONAL SCANNING MICROSCOPY WITH IMPROVED RESOLUTION

MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE