Pavel R. Zivny

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Bounded uncorrelated signal impairment deconvolution for total sign...
- Patent number 9,363,045
- Issue date Jun 7, 2016
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and systems for analyzing decomposed uncorrelated signal im...
- Patent number 9,130,751
- Issue date Sep 8, 2015
- Tektronix, Inc.
- Pavel R. Zivny
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for decomposing and analyzing jitter using spectral analysis...
- Patent number 8,594,169
- Issue date Nov 26, 2013
- Tektronix, Inc.
- Pavel Zivny
- G01 - MEASURING TESTING
Information Patent Grant
System for independently modifying jitter and noise components in a...
- Patent number 8,332,172
- Issue date Dec 11, 2012
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of characterizing parameters and removing spectral component...
- Patent number 8,155,165
- Issue date Apr 10, 2012
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sequential equivalent—time sampling with an asynchronous reference...
- Patent number 7,746,058
- Issue date Jun 29, 2010
- Tektronix, Inc.
- Michael A. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
External clock count based auto trigger for an oscilloscope
- Patent number 5,530,341
- Issue date Jun 25, 1996
- Tektronix, Inc.
- Pavel R. Zivny
- G01 - MEASURING TESTING
Information Patent Grant
Detection of metastability in triggers
- Patent number 5,268,851
- Issue date Dec 7, 1993
- Tektronix, Inc.
- Pavel R. Zivny
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION
- Publication number 20240255572
- Publication date Aug 1, 2024
- Tektronix, Inc.
- Muhammad Saad Chughtai
- G01 - MEASURING TESTING
Information Patent Application
SEMI-AUTOMATED OSCILLOSCOPE NOISE COMPENSATION BASED ON POWER SPECT...
- Publication number 20230324439
- Publication date Oct 12, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
MACHINE LEARNING MODEL TRAINING USING DE-NOISED DATA AND MODEL PRED...
- Publication number 20230228803
- Publication date Jul 20, 2023
- Tektronix, Inc.
- Wenzheng Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TERMINATION TRIGGER PICK-OFF FOR REMOTE HEAD SAMPLER
- Publication number 20230213556
- Publication date Jul 6, 2023
- Tektronix, Inc.
- Pavel R. Zivny
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ANALYZING DECOMPOSED UNCORRELATED SIGNAL IM...
- Publication number 20150350042
- Publication date Dec 3, 2015
- Tektronix, Inc.
- Pavel R. Zivny
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHODS AND SYSTEMS FOR ANALYZING DECOMPOSED UNCORRELATED SIGNAL IM...
- Publication number 20120226727
- Publication date Sep 6, 2012
- Tektronix, Inc.
- Pavel R. ZIVNY
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System for Independently Modifying Jitter and Noise Components in a...
- Publication number 20120158334
- Publication date Jun 21, 2012
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR DECOMPOSING AND ANALYZING JITTER USING SPECTRAL ANALYSIS...
- Publication number 20110292987
- Publication date Dec 1, 2011
- Tektronix, Inc.
- Pavel R. ZIVNY
- G01 - MEASURING TESTING
Information Patent Application
System for Independently Modifying Jitter and Noise Components in a...
- Publication number 20110103451
- Publication date May 5, 2011
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEQUENTIAL EQUIVALENT-TIME SAMPLING WITH AN ASYNCHRONOUS REFERENCE...
- Publication number 20090237072
- Publication date Sep 24, 2009
- Tektronix, Inc.
- Michael A. NELSON
- G01 - MEASURING TESTING
Information Patent Application
Method of Characterizing Parameters and Removing Spectral Component...
- Publication number 20090074030
- Publication date Mar 19, 2009
- Tektronix, Inc.
- Maria Agoston
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Pavel R. Zivny

Person

Patents Grantslast 30 patents

Bounded uncorrelated signal impairment deconvolution for total sign...

Methods and systems for analyzing decomposed uncorrelated signal im...

Method for decomposing and analyzing jitter using spectral analysis...

System for independently modifying jitter and noise components in a...

Method of characterizing parameters and removing spectral component...

Sequential equivalent—time sampling with an asynchronous reference...

External clock count based auto trigger for an oscilloscope

Detection of metastability in triggers

Patents Applicationslast 30 patents

TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION

SEMI-AUTOMATED OSCILLOSCOPE NOISE COMPENSATION BASED ON POWER SPECT...

MACHINE LEARNING MODEL TRAINING USING DE-NOISED DATA AND MODEL PRED...

TERMINATION TRIGGER PICK-OFF FOR REMOTE HEAD SAMPLER

METHODS AND SYSTEMS FOR ANALYZING DECOMPOSED UNCORRELATED SIGNAL IM...

METHODS AND SYSTEMS FOR ANALYZING DECOMPOSED UNCORRELATED SIGNAL IM...

System for Independently Modifying Jitter and Noise Components in a...

METHOD FOR DECOMPOSING AND ANALYZING JITTER USING SPECTRAL ANALYSIS...

System for Independently Modifying Jitter and Noise Components in a...

SEQUENTIAL EQUIVALENT-TIME SAMPLING WITH AN ASYNCHRONOUS REFERENCE...

Method of Characterizing Parameters and Removing Spectral Component...