Pavel Stejskal

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle detection for spectroscopic techniques
- Patent number 12,117,406
- Issue date Oct 15, 2024
- VG Systems Limited
- Bryan Barnard
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device for inspection of a specimen with a pl...
- Patent number 11,676,795
- Issue date Jun 13, 2023
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for dynamic band contrast imaging
- Patent number 11,195,693
- Issue date Dec 7, 2021
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
- Patent number 11,114,275
- Issue date Sep 7, 2021
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Grant
Measurement and endpointing of sample thickness
- Patent number 10,978,272
- Issue date Apr 13, 2021
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam electron microscope
- Patent number 10,937,627
- Issue date Mar 2, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrangement for X-Ray tomography
- Patent number 9,958,403
- Issue date May 1, 2018
- FEI Company
- Pavel Stejskal
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of acquiring EBSP patterns
- Patent number 9,618,463
- Issue date Apr 11, 2017
- FEI Company
- Marek Uncovský
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20250012742
- Publication date Jan 9, 2025
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTION FOR SPECTROSCOPIC TECHNIQUES
- Publication number 20220381713
- Publication date Dec 1, 2022
- VG System Limited
- Bryan Barnard
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20220136985
- Publication date May 5, 2022
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DYNAMIC BAND CONTRAST IMAGING
- Publication number 20210375582
- Publication date Dec 2, 2021
- FEI Company
- Tomás Vystavêl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...
- Publication number 20210296088
- Publication date Sep 23, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...
- Publication number 20210005420
- Publication date Jan 7, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS
- Publication number 20200135427
- Publication date Apr 30, 2020
- FEI Company
- Tomás Vystavel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM ELECTRON MICROSCOPE
- Publication number 20190378681
- Publication date Dec 12, 2019
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRANGEMENT FOR X-RAY TOMOGRAPHY
- Publication number 20180100815
- Publication date Apr 12, 2018
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ACQUIRING EBSP PATTERNS
- Publication number 20160054240
- Publication date Feb 25, 2016
- FEI Company
- Marek Uncovský
- G01 - MEASURING TESTING

Pavel Stejskal

Person

Patents Grantslast 30 patents

Charged particle detection for spectroscopic techniques

Methods and apparatus for electron backscatter diffraction sample c...

Charged particle beam device for inspection of a specimen with a pl...

Method and system for dynamic band contrast imaging

Methods and systems for acquiring electron backscatter diffraction...

Measurement and endpointing of sample thickness

Multi-beam electron microscope

Arrangement for X-Ray tomography

Method of acquiring EBSP patterns

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

CHARGED PARTICLE DETECTION FOR SPECTROSCOPIC TECHNIQUES

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

METHOD AND SYSTEM FOR DYNAMIC BAND CONTRAST IMAGING

CHARGED PARTICLE BEAM DEVICE FOR INSPECTION OF A SPECIMEN WITH A PL...

METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...

MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS

MULTI-BEAM ELECTRON MICROSCOPE

ARRANGEMENT FOR X-RAY TOMOGRAPHY

METHOD OF ACQUIRING EBSP PATTERNS