Pedro Barbosa Zanetta

Person

Campinas, BR

People

Patents Grantslast 30 patents

Information Patent Grant
Rail-to-rail source follower
- Patent number 10,205,423
- Issue date Feb 12, 2019
- NXP USA, INC.
- Pedro B. Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Feedback circuit and methods for negative charge pump
- Patent number 10,061,339
- Issue date Aug 28, 2018
- NXP USA, INC.
- Andre Luis Vilas Boas
- G11 - INFORMATION STORAGE
Information Patent Grant
Switching power converter
- Patent number 10,050,526
- Issue date Aug 14, 2018
- NXP USA, INC.
- Pedro Barbosa Zanetta
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor devices for sensing voltages
- Patent number 9,964,975
- Issue date May 8, 2018
- NXP USA, INC.
- Pedro Barbosa Zanetta
- G05 - CONTROLLING REGULATING
Information Patent Grant
Sample and hold circuit
- Patent number 9,741,449
- Issue date Aug 22, 2017
- NXP USA, INC.
- Pedro Barbosa Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Oscillator circuit
- Patent number 9,680,453
- Issue date Jun 13, 2017
- NXP USA, INC.
- Pedro Barbosa Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Cold-crank event management
- Patent number 9,644,593
- Issue date May 9, 2017
- NXP USA, INC.
- Adriano Marques Pereira
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Power gating techniques with smooth transition
- Patent number 9,509,305
- Issue date Nov 29, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ivan Carlos Ribeiro Nascimento
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Ready-flag circuitry for differential amplifiers
- Patent number 9,356,569
- Issue date May 31, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Andre Luis Vilas Boas
- G05 - CONTROLLING REGULATING
Information Patent Grant
Production-test die temperature measurement method and apparatus
- Patent number 9,310,261
- Issue date Apr 12, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo P. Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Voltage regulation system for integrated circuit
- Patent number 9,148,056
- Issue date Sep 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Pedro Barbosa Zanetta
- G05 - CONTROLLING REGULATING
Information Patent Grant
Temperature dependent biasing for leakage power reduction
- Patent number 9,110,484
- Issue date Aug 18, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Pedro Barbosa Zanetta
- G05 - CONTROLLING REGULATING
Information Patent Grant
Production-test die temperature measurement
- Patent number 9,074,943
- Issue date Jul 7, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza Coimbra
- G01 - MEASURING TESTING
Information Patent Grant
Power monitoring circuitry
- Patent number 8,901,991
- Issue date Dec 2, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Pedro Barbosa Zanetta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Rail-To-Rail Source Follower
- Publication number 20190052228
- Publication date Feb 14, 2019
- NXP USA, Inc.
- Pedro B. Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SWITCHING POWER CONVERTER
- Publication number 20180048320
- Publication date Feb 15, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Pedro Barbosa Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COLD-CRANK EVENT MANAGEMENT
- Publication number 20150211470
- Publication date Jul 30, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Adriano Marques Pereira
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Application
VOLTAGE REGULATION SYSTEM FOR INTEGRATED CIRCUIT
- Publication number 20150194886
- Publication date Jul 9, 2015
- Pedro Barbosa Zanetta
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
POWER GATING TECHNIQUES WITH SMOOTH TRANSITION
- Publication number 20150194887
- Publication date Jul 9, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Ivan Carlos Ribeiro Nascimento
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT METHOD AND APPARATUS
- Publication number 20150177075
- Publication date Jun 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- RICARDO P. COIMBRA
- G01 - MEASURING TESTING
Information Patent Application
READY-FLAG CIRCUITRY FOR DIFFERENTIAL AMPLIFIERS
- Publication number 20150109054
- Publication date Apr 23, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Andre Luis Vilas Boas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEMPERATURE DEPENDENT BIASING FOR LEAKAGE POWER REDUCTION
- Publication number 20150084684
- Publication date Mar 26, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Pedro Barbosa Zanetta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POWER MONITORING CIRCUITRY
- Publication number 20140285239
- Publication date Sep 25, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Pedro Barbosa Zanetta
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT
- Publication number 20140119405
- Publication date May 1, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ricardo Pureza COIMBRA
- G01 - MEASURING TESTING

Pedro Barbosa Zanetta

Person

Patents Grantslast 30 patents

Rail-to-rail source follower

Feedback circuit and methods for negative charge pump

Switching power converter

Semiconductor devices for sensing voltages

Sample and hold circuit

Oscillator circuit

Cold-crank event management

Power gating techniques with smooth transition

Ready-flag circuitry for differential amplifiers

Production-test die temperature measurement method and apparatus

Voltage regulation system for integrated circuit

Temperature dependent biasing for leakage power reduction

Production-test die temperature measurement

Power monitoring circuitry

Patents Applicationslast 30 patents

Rail-To-Rail Source Follower

SWITCHING POWER CONVERTER

COLD-CRANK EVENT MANAGEMENT

VOLTAGE REGULATION SYSTEM FOR INTEGRATED CIRCUIT

POWER GATING TECHNIQUES WITH SMOOTH TRANSITION

PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT METHOD AND APPARATUS

READY-FLAG CIRCUITRY FOR DIFFERENTIAL AMPLIFIERS

TEMPERATURE DEPENDENT BIASING FOR LEAKAGE POWER REDUCTION

POWER MONITORING CIRCUITRY

PRODUCTION-TEST DIE TEMPERATURE MEASUREMENT