Pedro Vagos

Person

Chennevieres, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Measurements of structures in presence of signal contaminations
- Patent number 12,092,962
- Issue date Sep 17, 2024
- Onto Innovation Inc.
- Jingsheng Shi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Vortex polarimeter
- Patent number 11,346,768
- Issue date May 31, 2022
- Onto Innovation Inc.
- Kenneth E. James
- G01 - MEASURING TESTING
Information Patent Grant
Correction of angular error of plane-of-incidence azimuth of optica...
- Patent number 10,621,264
- Issue date Apr 14, 2020
- Onto Innovation Inc.
- Pedro Vagos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correction of angular error of plane-of-incidence azimuth of optica...
- Patent number 10,296,554
- Issue date May 21, 2019
- Nanometrics Incorporated
- Pedro Vagos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deconvolution to reduce the effective spot size of a spectroscopic...
- Patent number 10,274,367
- Issue date Apr 30, 2019
- Nanometrics Incorporated
- Amit Shachaf
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology using differential fitting
- Patent number 9,995,689
- Issue date Jun 12, 2018
- Nanometrics Incorporated
- Pedro Vagos
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Deconvolution to reduce the effective spot size of a spectroscopic...
- Patent number 9,958,327
- Issue date May 1, 2018
- Nanometrics Incorporated
- Amit Shachaf
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mueller matrix spectroscopy using chiroptic
- Patent number 8,427,645
- Issue date Apr 23, 2013
- Nanometrics Incorporated
- Pedro Vagos
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VORTEX POLARIMETER
- Publication number 20220170847
- Publication date Jun 2, 2022
- ONTO INNOVATION INC.
- Kenneth E. James
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION OF ANGULAR ERROR OF PLANE-OF-INCIDENCE AZIMUTH OF OPTICA...
- Publication number 20190272305
- Publication date Sep 5, 2019
- Nanometrics Incorporated
- Pedro VAGOS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DECONVOLUTION TO REDUCE THE EFFECTIVE SPOT SIZE OF A SPECTROSCOPIC...
- Publication number 20180348055
- Publication date Dec 6, 2018
- Nanometrics Incorporated
- Amit Shachaf
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY USING DIFFERENTIAL FITTING
- Publication number 20160341670
- Publication date Nov 24, 2016
- Nanometrics Incorporated
- Pedro Vagos
- G01 - MEASURING TESTING
Information Patent Application
DECONVOLUTION TO REDUCE THE EFFECTIVE SPOT SIZE OF A SPECTROSCOPIC...
- Publication number 20160097677
- Publication date Apr 7, 2016
- Nanometrics Incorporated
- Amit Shachaf
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION OF ANGULAR ERROR OF PLANE-OF-INCIDENCE AZIMUTH OF OPTICA...
- Publication number 20140249768
- Publication date Sep 4, 2014
- Pedro Vagos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mueller Matrix Spectroscopy Using Chiroptic
- Publication number 20120176618
- Publication date Jul 12, 2012
- Nanometrics Incorporated
- Pedro Vagos
- G01 - MEASURING TESTING

Pedro Vagos

Person

Patents Grantslast 30 patents

Measurements of structures in presence of signal contaminations

Vortex polarimeter

Correction of angular error of plane-of-incidence azimuth of optica...

Correction of angular error of plane-of-incidence azimuth of optica...

Deconvolution to reduce the effective spot size of a spectroscopic...

Optical metrology using differential fitting

Deconvolution to reduce the effective spot size of a spectroscopic...

Mueller matrix spectroscopy using chiroptic

Patents Applicationslast 30 patents

VORTEX POLARIMETER

CORRECTION OF ANGULAR ERROR OF PLANE-OF-INCIDENCE AZIMUTH OF OPTICA...

DECONVOLUTION TO REDUCE THE EFFECTIVE SPOT SIZE OF A SPECTROSCOPIC...

OPTICAL METROLOGY USING DIFFERENTIAL FITTING

DECONVOLUTION TO REDUCE THE EFFECTIVE SPOT SIZE OF A SPECTROSCOPIC...

CORRECTION OF ANGULAR ERROR OF PLANE-OF-INCIDENCE AZIMUTH OF OPTICA...

Mueller Matrix Spectroscopy Using Chiroptic