Pei-Chun Liao

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Jhubei, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining time dependent dielectric breakdown
- Patent number 7,579,859
- Issue date Aug 25, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Pei-Chun Liao
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor devices
- Patent number 7,453,280
- Issue date Nov 18, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sheng-Hui Liang
- G11 - INFORMATION STORAGE
Information Patent Grant
One time programming memory cell using MOS device
- Patent number 7,307,880
- Issue date Dec 11, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-Yuan Ko
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method for Determining Time Dependent Dielectric Breakdown
- Publication number 20080309365
- Publication date Dec 18, 2008
- Pei-Chun Liao
- G01 - MEASURING TESTING
Information Patent Application
One time programming memory cell using MOS device
- Publication number 20070109852
- Publication date May 17, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-Yuan Ko
- G11 - INFORMATION STORAGE