Peilin Jiang

Follow

Person

Chandler, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic test pattern generation (ATPG) for parametric faults
- Patent number 11,669,667
- Issue date Jun 6, 2023
- Synopsys, Inc.
- Peilin Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Overlay metrology system and method
- Patent number 11,067,389
- Issue date Jul 20, 2021
- KLA Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Optimized spatial modeling for optical CD metrology
- Patent number 9,915,522
- Issue date Mar 13, 2018
- KLA-Tencor Corporation
- Peilin Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Techniques for optimized scatterometry
- Patent number 9,127,927
- Issue date Sep 8, 2015
- KLA-Tencor Corporation
- Jonathan Iloreta
- G01 - MEASURING TESTING
Information Patent Grant
Numerical aperture integration for optical critical dimension (OCD)...
- Patent number 8,762,100
- Issue date Jun 24, 2014
- Tokyo Electron Limited
- Hanyou Chu
- G01 - MEASURING TESTING
Information Patent Grant
Numerical aperture integration for optical critical dimension (OCD)...
- Patent number 8,670,948
- Issue date Mar 11, 2014
- Tokyo Electron Limited
- Hanyou Chu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST POINT INSERTION IN ANALOG CIRCUIT DESIGN TESTING
- Publication number 20240232485
- Publication date Jul 11, 2024
- Synopsys, Inc.
- Mayukh Bhattacharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC TEST PATTERN GENERATION TO INCREASE COVERAGE IN DETECTING...
- Publication number 20240193336
- Publication date Jun 13, 2024
- Synopsys, Inc.
- Peilin Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC TEST PATTERN GENERATION (ATPG) FOR PARAMETRIC FAULTS
- Publication number 20210264087
- Publication date Aug 26, 2021
- Synopsys, Inc.
- Peilin Jiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Overlay Metrology System and Method
- Publication number 20190285407
- Publication date Sep 19, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Application
NUMERICAL APERTURE INTEGRATION FOR OPTICAL CRITICAL DIMENSION (OCD)...
- Publication number 20130211760
- Publication date Aug 15, 2013
- Hanyou CHU
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES FOR OPTIMIZED SCATTEROMETRY
- Publication number 20130158948
- Publication date Jun 20, 2013
- Jonathan Iloreta
- G01 - MEASURING TESTING