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last 30 patents
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Patent Grant
High-frequency component test device and method thereof
Patent number
12,163,989
Issue date
Dec 10, 2024
Industrial Technology Research Institute
Sih-Han Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
HIGH-FREQUENCY COMPONENT TEST DEVICE AND METHOD THEREOF
Publication number
20250044332
Publication date
Feb 6, 2025
Industrial Technology Research Institute
Sih-Han LI
G01 - MEASURING TESTING
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Patent Application
CONFIGURABLE COMPUTING UNIT WITHIN MEMORY
Publication number
20220413801
Publication date
Dec 29, 2022
Industrial Technology Research Institute
Jian-Wei Su
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
HIGH-FREQUENCY COMPONENT TEST DEVICE AND METHOD THEREOF
Publication number
20220341978
Publication date
Oct 27, 2022
Industrial Technology Research Institute
Sih-Han LI
G01 - MEASURING TESTING