Peng LIU

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Mask synthesis using tensor-based computing platforms
- Patent number 12,181,793
- Issue date Dec 31, 2024
- Synopsys, Inc.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic devices with dynamic brightness ranges for passthrough d...
- Patent number 12,067,909
- Issue date Aug 20, 2024
- Apple Inc.
- Elizabeth Pieri
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Methods of determining scattering of radiation by structures of fin...
- Patent number 11,789,371
- Issue date Oct 17, 2023
- ASML Netherlands B.V.
- Yu Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional mask simulations based on feature images
- Patent number 11,704,471
- Issue date Jul 18, 2023
- Synopsys, Inc.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 11,461,532
- Issue date Oct 4, 2022
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of determining scattering of radiation by structures of fin...
- Patent number 11,409,203
- Issue date Aug 9, 2022
- ASML Netherlands B.V.
- Yu Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of determining scattering of radiation by structures of fin...
- Patent number 11,016,395
- Issue date May 25, 2021
- ASML Netherlands B.V.
- Yu Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of determining scattering of radiation by structures of fin...
- Patent number 10,996,565
- Issue date May 4, 2021
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Preserving trust data during operating system updates of a secure e...
- Patent number 10,936,719
- Issue date Mar 2, 2021
- Apple Inc.
- Hervé Sibert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for evaluating resist development
- Patent number 10,901,322
- Issue date Jan 26, 2021
- ASML Netherlands B.V.
- Peng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 10,839,131
- Issue date Nov 17, 2020
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography model for 3D features
- Patent number 10,685,158
- Issue date Jun 16, 2020
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithographic mask functions to model the incident angles of a parti...
- Patent number 10,656,528
- Issue date May 19, 2020
- Synopsys, Inc.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for determining resist deformation
- Patent number 10,423,076
- Issue date Sep 24, 2019
- ASML Netherlands B.V.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Data service protection for cloud management platforms
- Patent number 10,402,090
- Issue date Sep 3, 2019
- EMC IP Holding Company LLC
- Ynn-Pyng Tsaur
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography model for three-dimensional patterning device
- Patent number 10,359,704
- Issue date Jul 23, 2019
- ASML Netherlands B.V.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Countersigning updates for multi-chip devices
- Patent number 10,303,884
- Issue date May 28, 2019
- Apple Inc.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 10,198,549
- Issue date Feb 5, 2019
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lens heating aware source mask optimization for advanced lithography
- Patent number 9,940,427
- Issue date Apr 10, 2018
- ASML Netherlands B.V.
- Michael Matthew M. Crouse
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography model for 3D topographic wafers
- Patent number 9,835,955
- Issue date Dec 5, 2017
- ASML Netherlands B.V.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lens heating compensation systems and methods
- Patent number 9,746,784
- Issue date Aug 29, 2017
- ASML Netherlands B.V.
- Jun Ye
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Baseband secure boot with remote storage
- Patent number 9,563,765
- Issue date Feb 7, 2017
- Apple Inc.
- Samuel D. Post
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 9,372,957
- Issue date Jun 21, 2016
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography model for 3D resist profile simulations
- Patent number 9,235,662
- Issue date Jan 12, 2016
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 8,938,694
- Issue date Jan 20, 2015
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 8,589,829
- Issue date Nov 19, 2013
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lens heating compensation systems and methods
- Patent number 8,570,485
- Issue date Oct 29, 2013
- ASML Netherlands B.V.
- Jun Ye
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional mask model for photolithography simulation
- Patent number 8,352,885
- Issue date Jan 8, 2013
- ASML Netherlands B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Plane waves to control critical dimension
- Patent number 8,071,279
- Issue date Dec 6, 2011
- Intel Corporation
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Plane waves to control critical dimension
- Patent number 7,974,027
- Issue date Jul 5, 2011
- Intel Corporation
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Electronic Devices with Dynamic Brightness Ranges for Passthrough D...
- Publication number 20240355246
- Publication date Oct 24, 2024
- Apple Inc.
- Elizabeth Pieri
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Electronic Devices with Dynamic Brightness Ranges for Passthrough D...
- Publication number 20240203306
- Publication date Jun 20, 2024
- Apple Inc.
- Elizabeth Pieri
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
DISPLAYING A VIRTUAL DISPLAY
- Publication number 20230298281
- Publication date Sep 21, 2023
- Apple Inc.
- Timothy R. PEASE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mask Synthesis Integrating Mask Fabrication Effects and Wafer Litho...
- Publication number 20230152683
- Publication date May 18, 2023
- Synopsys, Inc.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK FABRICATION EFFECTS IN THREE-DIMENSIONAL MASK SIMULATIONS USIN...
- Publication number 20230104510
- Publication date Apr 6, 2023
- Synopsys, Inc.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK CORNER ROUNDING EFFECTS IN THREE-DIMENSIONAL MASK SIMULATIONS...
- Publication number 20230079453
- Publication date Mar 16, 2023
- Synopsys, Inc.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...
- Publication number 20220373892
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Yu CAO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THREE-DIMENSIONAL MASK SIMULATIONS BASED ON FEATURE IMAGES
- Publication number 20220082932
- Publication date Mar 17, 2022
- Synopsys, Inc.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for Bandwidth Efficient Video Communication Using Machine...
- Publication number 20220021887
- Publication date Jan 20, 2022
- Wisconsin Alumni Research Foundation
- Suman Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...
- Publication number 20210271173
- Publication date Sep 2, 2021
- ASML NETHERLANDS B.V.
- Yu CAO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20210064811
- Publication date Mar 4, 2021
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PLAN BUFFERING FOR LOW-LATENCY POLICY UPDATES
- Publication number 20200257296
- Publication date Aug 13, 2020
- Samsung Electronics Co., Ltd.
- Peng Liu
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS FOR EVALUATING RESIST DEVELOPMENT
- Publication number 20200124973
- Publication date Apr 23, 2020
- Peng LIU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...
- Publication number 20200073260
- Publication date Mar 5, 2020
- ASML NETHERLANDS B.V.
- Yu CAO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...
- Publication number 20200012196
- Publication date Jan 9, 2020
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20190163866
- Publication date May 30, 2019
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR DETERMINING RESIST DEFORMATION
- Publication number 20180246419
- Publication date Aug 30, 2018
- ASML NETHERLANDS B.V.
- Peng LIU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PRESERVING TRUST DATA DURING OPERATING SYSTEM UPDATES OF A SECURE E...
- Publication number 20180089434
- Publication date Mar 29, 2018
- Apple Inc.
- Hervé Sibert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COUNTERSIGNING UPDATES FOR MULTI-CHIP DEVICES
- Publication number 20180082065
- Publication date Mar 22, 2018
- Apple Inc.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHY MODEL FOR 3D FEATURES
- Publication number 20170262564
- Publication date Sep 14, 2017
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20160357900
- Publication date Dec 8, 2016
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BASEBAND SECURE BOOT WITH REMOTE STORAGE
- Publication number 20160232343
- Publication date Aug 11, 2016
- Apple Inc.
- Samuel D. Post
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A LITHOGRAPHY MODEL FOR THREE-DIMENSIONAL PATTERNING DEVICE
- Publication number 20150378264
- Publication date Dec 31, 2015
- ASML NETHERLANDS B.V.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20150135146
- Publication date May 14, 2015
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20140195993
- Publication date Jul 10, 2014
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LENS HEATING COMPENSATION SYSTEMS AND METHODS
- Publication number 20140047397
- Publication date Feb 13, 2014
- ASML NETHERLANDS B.V.
- Jun YE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LENS HEATING AWARE SOURCE MASK OPTIMIZATION FOR ADVANCED LITHOGRAPHY
- Publication number 20130212543
- Publication date Aug 15, 2013
- ASML NETHERLANDS B.V.
- Michael Matthew M. CROUSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lithography Model For 3D Resist Profile Simulations
- Publication number 20130204594
- Publication date Aug 8, 2013
- ASML NETHERLANDS B.V.
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION
- Publication number 20130139118
- Publication date May 30, 2013
- ASML NETHERLANDS B.V.
- Peng LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lithography Model for 3D Topographic Wafers
- Publication number 20130042211
- Publication date Feb 14, 2013
- ASML NETHERLANDS B.V.
- Peng Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Mask synthesis using tensor-based computing platforms

Electronic devices with dynamic brightness ranges for passthrough d...

Methods of determining scattering of radiation by structures of fin...

Three-dimensional mask simulations based on feature images

Three-dimensional mask model for photolithography simulation

Methods of determining scattering of radiation by structures of fin...

Methods of determining scattering of radiation by structures of fin...

Methods of determining scattering of radiation by structures of fin...

Preserving trust data during operating system updates of a secure e...

Methods for evaluating resist development

Three-dimensional mask model for photolithography simulation

Lithography model for 3D features

Lithographic mask functions to model the incident angles of a parti...

Methods for determining resist deformation

Data service protection for cloud management platforms

Lithography model for three-dimensional patterning device

Countersigning updates for multi-chip devices

Three-dimensional mask model for photolithography simulation

Lens heating aware source mask optimization for advanced lithography

Lithography model for 3D topographic wafers

Lens heating compensation systems and methods

Baseband secure boot with remote storage

Three-dimensional mask model for photolithography simulation

Lithography model for 3D resist profile simulations

Three-dimensional mask model for photolithography simulation

Three-dimensional mask model for photolithography simulation

Lens heating compensation systems and methods

Three-dimensional mask model for photolithography simulation

Plane waves to control critical dimension

Plane waves to control critical dimension

Patents Applicationslast 30 patents

Electronic Devices with Dynamic Brightness Ranges for Passthrough D...

Electronic Devices with Dynamic Brightness Ranges for Passthrough D...

DISPLAYING A VIRTUAL DISPLAY

Mask Synthesis Integrating Mask Fabrication Effects and Wafer Litho...

MASK FABRICATION EFFECTS IN THREE-DIMENSIONAL MASK SIMULATIONS USIN...

MASK CORNER ROUNDING EFFECTS IN THREE-DIMENSIONAL MASK SIMULATIONS...

METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...

THREE-DIMENSIONAL MASK SIMULATIONS BASED ON FEATURE IMAGES

Apparatus for Bandwidth Efficient Video Communication Using Machine...

METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

PLAN BUFFERING FOR LOW-LATENCY POLICY UPDATES

METHODS FOR EVALUATING RESIST DEVELOPMENT

METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...

METHODS OF DETERMINING SCATTERING OF RADIATION BY STRUCTURES OF FIN...

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

METHODS FOR DETERMINING RESIST DEFORMATION

PRESERVING TRUST DATA DURING OPERATING SYSTEM UPDATES OF A SECURE E...

COUNTERSIGNING UPDATES FOR MULTI-CHIP DEVICES

LITHOGRAPHY MODEL FOR 3D FEATURES

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

BASEBAND SECURE BOOT WITH REMOTE STORAGE

A LITHOGRAPHY MODEL FOR THREE-DIMENSIONAL PATTERNING DEVICE

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

LENS HEATING COMPENSATION SYSTEMS AND METHODS

LENS HEATING AWARE SOURCE MASK OPTIMIZATION FOR ADVANCED LITHOGRAPHY

Lithography Model For 3D Resist Profile Simulations

THREE-DIMENSIONAL MASK MODEL FOR PHOTOLITHOGRAPHY SIMULATION

Lithography Model for 3D Topographic Wafers