Peng Luan

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Shijiazhuang, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining parameters in on-wafer calibration piece model
- Patent number 11,971,451
- Issue date Apr 30, 2024
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Aihua Wu
- G01 - MEASURING TESTING
Information Patent Grant
Two-port on-wafer calibration piece circuit model and method for de...
- Patent number 11,733,298
- Issue date Aug 22, 2023
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and terminal equipment of terahertz frequency ba...
- Patent number 11,385,175
- Issue date Jul 12, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Calibrating Crosstalk Errors in System for Measuring on-...
- Publication number 20230051442
- Publication date Feb 16, 2023
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Aihua Wu
- G01 - MEASURING TESTING
Information Patent Application
Two-Port On-Wafer Calibration Piece Circuit Model and Method for De...
- Publication number 20220107361
- Publication date Apr 7, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining Parameters in On-Wafer Calibration Piece Model
- Publication number 20220099736
- Publication date Mar 31, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Aihua Wu
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD AND TERMINAL EQUIPMENT OF TERAHERTZ FREQUENCY BA...
- Publication number 20210181102
- Publication date Jun 17, 2021
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING