Pengsong XU

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Suzhou, CN

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Patents Grantslast 30 patents

Information Patent Grant
Heating structure and wafer test device
- Patent number 12,237,184
- Issue date Feb 25, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-level semiconductor high-voltage reliability test fixture
- Patent number 12,228,603
- Issue date Feb 18, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTURE
- Publication number 20250012845
- Publication date Jan 9, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...
- Publication number 20240310433
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING