Pengyu HAN

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and mechanisms for generating virtual knobs for model perfo...
- Patent number 12,236,077
- Issue date Feb 25, 2025
- Applied Materials, Inc.
- Jui-Che Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerating preventative maintenance recovery and recipe optimizin...
- Patent number 12,106,984
- Issue date Oct 1, 2024
- Applied Materials, Inc.
- Pengyu Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable achromatic collimator assembly for endpoint detection sy...
- Patent number 12,066,639
- Issue date Aug 20, 2024
- Applied Materials, Inc.
- Pengyu Han
- G02 - OPTICS
Information Patent Grant
Endpoint detection system for enhanced spectral data collection
- Patent number 11,965,798
- Issue date Apr 23, 2024
- Applied Materials, Inc.
- Pengyu Han
- G01 - MEASURING TESTING
Information Patent Grant
Substrate process endpoint detection using machine learning
- Patent number 11,901,203
- Issue date Feb 13, 2024
- Applied Materials, Inc.
- Pengyu Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adjustable achromatic collimator assembly for endpoint detection sy...
- Patent number 11,719,952
- Issue date Aug 8, 2023
- Applied Materials, Inc.
- Pengyu Han
- G02 - OPTICS
Information Patent Grant
Autonomous substrate processing system
- Patent number 11,709,477
- Issue date Jul 25, 2023
- Applied Materials, Inc.
- Priyadarshi Panda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Eliminating internal reflections in an interferometric endpoint det...
- Patent number 11,421,977
- Issue date Aug 23, 2022
- Applied Materials, Inc.
- Lei Lian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz radiation anti-reflection devices and methods for handlin...
- Patent number 8,338,802
- Issue date Dec 25, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G02 - OPTICS
Information Patent Grant
Tunable broadband anti-relfection apparatus
- Patent number 8,299,435
- Issue date Oct 30, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
ACCELERATING PREVENTATIVE MAINTENANCE RECOVERY AND RECIPE OPTIMIZIN...
- Publication number 20250022733
- Publication date Jan 16, 2025
- Applied Materials, Inc.
- Pengyu Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINT DETECTION SYSTEM FOR ENHANCED SPECTRAL DATA COLLECTION
- Publication number 20240230462
- Publication date Jul 11, 2024
- Applied Materials, Inc.
- Pengyu Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND MECHANISMS FOR GENERATING VIRTUAL KNOBS FOR MODEL PERFO...
- Publication number 20230342016
- Publication date Oct 26, 2023
- Applied Materials, Inc.
- Jui-Che Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTABLE ACHROMATIC COLLIMATOR ASSEMBLY FOR ENDPOINT DETECTION SY...
- Publication number 20230341699
- Publication date Oct 26, 2023
- Applied Materials, Inc.
- Pengyu Han
- G02 - OPTICS
Information Patent Application
AUTONOMOUS SUBSTRATE PROCESSING SYSTEM
- Publication number 20230305531
- Publication date Sep 28, 2023
- Applied Materials, Inc.
- Priyadarshi Panda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING MODEL GENERATION AND UPDATING FOR MANUFACTURING EQ...
- Publication number 20230306281
- Publication date Sep 28, 2023
- Applied Materials, Inc.
- Pengyu Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATING PREVENTATIVE MAINTENANCE RECOVERY AND RECIPE OPTIMIZIN...
- Publication number 20230163002
- Publication date May 25, 2023
- Applied Materials, Inc.
- Pengyu Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINT DETECTION SYSTEM FOR ENHANCED SPECTRAL DATA COLLECTION
- Publication number 20220397482
- Publication date Dec 15, 2022
- Applied Materials, Inc.
- Pengyu Han
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESS ENDPOINT DETECTION USING MACHINE LEARNING
- Publication number 20220399215
- Publication date Dec 15, 2022
- Applied Materials, Inc.
- Pengyu Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBTAINING SUBSTRATE METROLOGY MEASUREMENT VALUES USING MACHINE LEAR...
- Publication number 20220397515
- Publication date Dec 15, 2022
- Applied Materials, Inc.
- Pengyu Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTONOMOUS SUBSTRATE PROCESSING SYSTEM
- Publication number 20220214662
- Publication date Jul 7, 2022
- Applied Materials, Inc.
- Priyadarshi Panda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL CABLE FOR INTERFEROMETRIC ENDPOINT DETECTION
- Publication number 20220148862
- Publication date May 12, 2022
- Applied Materials, Inc.
- Lei LIAN
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE ACHROMATIC COLLIMATOR ASSEMBLY FOR ENDPOINT DETECTION SY...
- Publication number 20220050303
- Publication date Feb 17, 2022
- Applied Materials, Inc.
- Pengyu Han
- G02 - OPTICS
Information Patent Application
ELIMINATING INTERNAL REFLECTIONS IN AN INTERFEROMETRIC ENDPOINT DET...
- Publication number 20200124399
- Publication date Apr 23, 2020
- APPLIED MATERIALS, INC.
- Lei LIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TILTED INTERFEROMETRIC ENDPOINT (IEP) WINDOW FOR SENSITIVITY IMPROV...
- Publication number 20200013588
- Publication date Jan 9, 2020
- Applied Materials, Inc.
- Lei LIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ RADIATION ANTI-REFLECTION DEVICES AND METHODS FOR HANDLIN...
- Publication number 20120049090
- Publication date Mar 1, 2012
- Rensselaer Polytechnic Institute
- Xi-Cheng ZHANG
- G02 - OPTICS
Information Patent Application
TUNABLE BROADBAND ANTI-RELFECTION APPARATUS
- Publication number 20110036984
- Publication date Feb 17, 2011
- Rensselaer Polytechnic Institute
- Xi-Cheng ZHANG
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Methods and mechanisms for generating virtual knobs for model perfo...

Accelerating preventative maintenance recovery and recipe optimizin...

Adjustable achromatic collimator assembly for endpoint detection sy...

Endpoint detection system for enhanced spectral data collection

Substrate process endpoint detection using machine learning

Adjustable achromatic collimator assembly for endpoint detection sy...

Autonomous substrate processing system

Eliminating internal reflections in an interferometric endpoint det...

Terahertz radiation anti-reflection devices and methods for handlin...

Tunable broadband anti-relfection apparatus

Patents Applicationslast 30 patents

ACCELERATING PREVENTATIVE MAINTENANCE RECOVERY AND RECIPE OPTIMIZIN...

ENDPOINT DETECTION SYSTEM FOR ENHANCED SPECTRAL DATA COLLECTION

METHODS AND MECHANISMS FOR GENERATING VIRTUAL KNOBS FOR MODEL PERFO...

ADJUSTABLE ACHROMATIC COLLIMATOR ASSEMBLY FOR ENDPOINT DETECTION SY...

AUTONOMOUS SUBSTRATE PROCESSING SYSTEM

MACHINE LEARNING MODEL GENERATION AND UPDATING FOR MANUFACTURING EQ...

ACCELERATING PREVENTATIVE MAINTENANCE RECOVERY AND RECIPE OPTIMIZIN...

ENDPOINT DETECTION SYSTEM FOR ENHANCED SPECTRAL DATA COLLECTION

SUBSTRATE PROCESS ENDPOINT DETECTION USING MACHINE LEARNING

OBTAINING SUBSTRATE METROLOGY MEASUREMENT VALUES USING MACHINE LEAR...

AUTONOMOUS SUBSTRATE PROCESSING SYSTEM

OPTICAL CABLE FOR INTERFEROMETRIC ENDPOINT DETECTION

ADJUSTABLE ACHROMATIC COLLIMATOR ASSEMBLY FOR ENDPOINT DETECTION SY...

ELIMINATING INTERNAL REFLECTIONS IN AN INTERFEROMETRIC ENDPOINT DET...

TILTED INTERFEROMETRIC ENDPOINT (IEP) WINDOW FOR SENSITIVITY IMPROV...

TERAHERTZ RADIATION ANTI-REFLECTION DEVICES AND METHODS FOR HANDLIN...

TUNABLE BROADBAND ANTI-RELFECTION APPARATUS