Peter A. de Kloe

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Dongen, NL

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for investigating a characteristic of a materia...
- Patent number 8,835,842
- Issue date Sep 16, 2014
- EDAX
- Stuart I. Wright
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electron pattern imaging
- Patent number 8,735,815
- Issue date May 27, 2014
- EDAX, Inc.
- Reinhard Buchhold
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Material Texture Analysis
- Publication number 20150109431
- Publication date Apr 23, 2015
- EDAX, MATERIALS ANALYSIS DIVISION OF AMETEK INC.
- Stuart I. Wright
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Electron Pattern Imaging
- Publication number 20130341506
- Publication date Dec 26, 2013
- Reinhard Buchhold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Investigating a Characteristic of a Materia...
- Publication number 20130193321
- Publication date Aug 1, 2013
- EDAX Inc.
- Stuart I. Wright
- G01 - MEASURING TESTING