Peter Binkhoff

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Dortmund, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring a microelectromechanical semiconductor component
- Patent number 9,322,731
- Issue date Apr 26, 2016
- Elmos Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method and device for measuring a microelectromechanical semiconduc...
- Patent number 8,943,907
- Issue date Feb 3, 2015
- Elmos Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING A MICROELECTROMECHANICAL SEMICONDUCTOR COMPONENT
- Publication number 20130263643
- Publication date Oct 10, 2013
- ELMOS Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND DEVICE FOR MEASURING A MICROELECTROMECHANICAL SEMICONDUC...
- Publication number 20130247688
- Publication date Sep 26, 2013
- ELMOS Semiconductor AG
- Peter Binkhoff
- B81 - MICRO-STRUCTURAL TECHNOLOGY