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Peter Boggild
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Copenhagen, DK
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Patents Grants
last 30 patents
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Patent Grant
Automatic identification of single- and/or few-layer thin-film mate...
Patent number
9,251,601
Issue date
Feb 2, 2016
Danmarks Tekniske Universitet
Bjarke Sørensen Jessen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-point probe
Patent number
7,323,890
Issue date
Jan 29, 2008
Capres APS
Christian Leth Petersen
G01 - MEASURING TESTING
Information
Patent Grant
Nano-drive for high resolution positioning and for positioning of a...
Patent number
7,304,486
Issue date
Dec 4, 2007
Capres A/S
Christian Leth Petersen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TWO-DIMENSIONAL MATERIAL AND HETEROSTRUCTURES ON AN INTERMEDIATE PO...
Publication number
20240047202
Publication date
Feb 8, 2024
Danmarks Tekniske Universitet
Abhay Shivayogimath
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrochemical Method for Transferring Graphene
Publication number
20160159064
Publication date
Jun 9, 2016
DANMARKS TEKNISKE UNIVERSITET
Filippo Pizzocchero
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
AUTOMATIC IDENTIFICATION OF SINGLE- AND/OR FEW-LAYER THIN-FILM MATE...
Publication number
20150199826
Publication date
Jul 16, 2015
DANMARKS TEKNISKE UNIVERSITET
Bjarke Sørensen Jessen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Multi-point probe
Publication number
20040056674
Publication date
Mar 25, 2004
Capres APS
Christian Leth Petersen
G01 - MEASURING TESTING
Information
Patent Application
Nano-drive for high resolution positioning and for positioning of a...
Publication number
20020153909
Publication date
Oct 24, 2002
Christian Leth Petersen
G01 - MEASURING TESTING
Information
Patent Application
Fabrication and application of nano-manipulators with induced growth
Publication number
20020061662
Publication date
May 23, 2002
Peter Boggild
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Multi-point probe
Publication number
20010050565
Publication date
Dec 13, 2001
Christian Leth Petersen
G01 - MEASURING TESTING