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Peter Brockhaus
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Dresden, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Battery, a battery element and a method for forming a battery
Patent number
10,326,159
Issue date
Jun 18, 2019
Infineon Technologies AG
Marko Lemke
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer arrangement, a method for testing a wafer, and a method for p...
Patent number
10,056,305
Issue date
Aug 21, 2018
Infineon Technologies Dresden GmbH
Peter Brockhaus
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Battery, a battery element and a method for forming a battery
Patent number
9,705,151
Issue date
Jul 11, 2017
Infineon Technologies AG
Marko Lemke
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer arrangement, a method for testing a wafer, and a method for p...
Patent number
9,627,341
Issue date
Apr 18, 2017
Infineon Technologies Dresden GmbH
Peter Brockhaus
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Battery, a Battery Element and a Method for Forming a Battery
Publication number
20170279150
Publication date
Sep 28, 2017
INFINEON TECHNOLOGIES AG
Marko Lemke
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER ARRANGEMENT, A METHOD FOR TESTING A WAFER, AND A METHOD FOR P...
Publication number
20170213773
Publication date
Jul 27, 2017
INFINEON TECHNOLOGIES DRESDEN GMBH
Peter Brockhaus
G01 - MEASURING TESTING
Information
Patent Application
Battery, a Battery Element and a Method for Forming a Battery
Publication number
20150280276
Publication date
Oct 1, 2015
INFINEON TECHNOLOGIES AG
Marko Lemke
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER ARRANGEMENT, A METHOD FOR TESTING A WAFER, AND A METHOD FOR P...
Publication number
20150115444
Publication date
Apr 30, 2015
INFINEON TECHNOLOGIES DRESDEN GMBH
Peter Brockhaus
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSOR DEVICE, A DETECTOR ARRANGEMENT AND A METHOD FOR DETECTING AR...
Publication number
20140015523
Publication date
Jan 16, 2014
INFINEON TECHNOLOGIES AG
Jan Rupf
G01 - MEASURING TESTING