Peter Christiaan Tiemeijer

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Transmission charged particle microscope with adjustable beam energ...
- Patent number 11,024,483
- Issue date Jun 1, 2021
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with improved EELS/EFTEM m...
- Patent number 10,559,448
- Issue date Feb 11, 2020
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE MICROSCOPE HAVING VACUUM IN SPECIMEN CHAMBER
- Publication number 20240112878
- Publication date Apr 4, 2024
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH ADJUSTABLE BEAM ENERG...
- Publication number 20190378680
- Publication date Dec 12, 2019
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS