Peter Christiaan Tiemeijer

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 12,176,179
- Issue date Dec 24, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy spectrometer with dynamic focus
- Patent number 12,100,585
- Issue date Sep 24, 2024
- FEI Company
- Arthur Reinout Hartong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 11,955,310
- Issue date Apr 9, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining an energy width of a charged particle beam
- Patent number 11,948,771
- Issue date Apr 2, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,817,290
- Issue date Nov 14, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a specimen using a transmission charged particle...
- Patent number 11,810,751
- Issue date Nov 7, 2023
- FEI Company
- Peter Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron optical module for providing an off-axial electron beam wi...
- Patent number 11,804,357
- Issue date Oct 31, 2023
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for reducing the charging effect in a transmissio...
- Patent number 11,715,618
- Issue date Aug 1, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for reducing off-axial aberration in elec...
- Patent number 11,587,759
- Issue date Feb 21, 2023
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field free sample plane for charged particle microscope
- Patent number 11,450,505
- Issue date Sep 20, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sixth-order and above corrected STEM multipole correctors
- Patent number 11,114,271
- Issue date Sep 7, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron-beam imaging apparatus with improved performance
- Patent number 10,971,326
- Issue date Apr 6, 2021
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for energy resolved chroma imaging
- Patent number 10,923,308
- Issue date Feb 16, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EELS detection technique in an electron microscope
- Patent number 10,832,901
- Issue date Nov 10, 2020
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy loss spectroscopy with adjustable energy resolution
- Patent number 10,522,323
- Issue date Dec 31, 2019
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emission noise correction of a charged particle source
- Patent number 10,453,647
- Issue date Oct 22, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post column filter with enhanced energy range
- Patent number 10,431,420
- Issue date Oct 1, 2019
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gun lens design in a charged particle microscope
- Patent number 10,410,827
- Issue date Sep 10, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with imaging beam rotation
- Patent number 10,224,174
- Issue date Mar 5, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration measurement in a charged particle microscope
- Patent number 10,157,727
- Issue date Dec 18, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopy in a transmission charged-particle microscope
- Patent number 9,991,087
- Issue date Jun 5, 2018
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post column filter with enhanced energy range
- Patent number 9,978,561
- Issue date May 22, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope with special aperture plate
- Patent number 9,934,936
- Issue date Apr 3, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using an environmental transmission electron microscope
- Patent number 9,570,270
- Issue date Feb 14, 2017
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing spectroscopy in a transmission charged-particl...
- Patent number 9,524,851
- Issue date Dec 20, 2016
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of investigating and correcting aberrations in a charged-par...
- Patent number 9,136,087
- Issue date Sep 15, 2015
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous electron detection
- Patent number 8,859,966
- Issue date Oct 14, 2014
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing and imaging a lamella in a particle-optical app...
- Patent number 8,766,214
- Issue date Jul 1, 2014
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of use for a multipole detector for a transmission electron...
- Patent number 8,692,196
- Issue date Apr 8, 2014
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY
- Publication number 20240347314
- Publication date Oct 17, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LO...
- Publication number 20240258067
- Publication date Aug 1, 2024
- FEI Company
- Peter Christiaan TIEMEIJER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detectors For Microscopy
- Publication number 20240242929
- Publication date Jul 18, 2024
- FEI Company
- Luigi Mele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS Auto-Alignment Using Full Image Simulation
- Publication number 20240194466
- Publication date Jun 13, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...
- Publication number 20240128050
- Publication date Apr 18, 2024
- FEI Company
- Yuchen DENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SENSOR PROTECTION IN ELECTRON IMAGING APPLICATIONS
- Publication number 20240055222
- Publication date Feb 15, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20240029993
- Publication date Jan 25, 2024
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20230223231
- Publication date Jul 13, 2023
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON OPTICAL MODULE FOR PROVIDING AN OFF-AXIAL ELECTRON BEAM WI...
- Publication number 20230101108
- Publication date Mar 30, 2023
- FEI Company
- Ali MOHAMMADI-GHEIDARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR REDUCING THE CHARGING EFFECT IN A TRANSMISSIO...
- Publication number 20230040558
- Publication date Feb 9, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENERGY SPECTROMETER WITH DYNAMIC FOCUS
- Publication number 20230005733
- Publication date Jan 5, 2023
- FEI Company
- Arthur Reinout HARTONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE
- Publication number 20220317067
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE
- Publication number 20220199353
- Publication date Jun 23, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING AN ENERGY WIDTH OF A CHARGED PARTICLE BEAM
- Publication number 20220148849
- Publication date May 12, 2022
- FEI Company
- Peter Christiaan TIEMEIJER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF IMAGING A SPECIMEN USING A TRANSMISSION CHARGED PARTICLE...
- Publication number 20210407762
- Publication date Dec 30, 2021
- FEI Company
- Peter TIEMEIJER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LO...
- Publication number 20210305013
- Publication date Sep 30, 2021
- FEI Company
- Peter Christiaan TIEMEIJER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
- Publication number 20210272767
- Publication date Sep 2, 2021
- FEI Company
- Maarten BISCHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIXTH-ORDER AND ABOVE CORRECTED STEM MULTIPOLE CORRECTORS
- Publication number 20210159044
- Publication date May 27, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE
- Publication number 20200090899
- Publication date Mar 19, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
- Publication number 20190341243
- Publication date Nov 7, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON ENERGY LOSS SPECTROSCOPY WITH ADJUSTABLE ENERGY RESOLUTION
- Publication number 20190311880
- Publication date Oct 10, 2019
- FEI Company
- Peter Christiaan TIEMEIJER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180323036
- Publication date Nov 8, 2018
- FEI Company
- Ali Mohammadi-Gheidari
- G02 - OPTICS
Information Patent Application
ABERRATION MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20180254168
- Publication date Sep 6, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POST COLUMN FILTER WITH ENHANCED ENERGY RANGE
- Publication number 20180254169
- Publication date Sep 6, 2018
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE
- Publication number 20180233322
- Publication date Aug 16, 2018
- FEI Company
- Ali Mohammadi Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POST COLUMN FILTER WITH ENHANCED ENERGY RANGE
- Publication number 20170125210
- Publication date May 4, 2017
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH SPECIAL APERTURE PLATE
- Publication number 20160111247
- Publication date Apr 21, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE
- Publication number 20160086762
- Publication date Mar 24, 2016
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of performing spectroscopy in a Transmission Charged-Particl...
- Publication number 20160071689
- Publication date Mar 10, 2016
- FEI Company
- Erwin Fernand de Jong
- H01 - BASIC ELECTRIC ELEMENTS

Peter Christiaan Tiemeijer

Person

Patents Grantslast 30 patents

Method, device and system for reducing off-axial aberration in elec...

Energy spectrometer with dynamic focus

Method and system to determine crystal structure

Transmission charged particle microscope with an electron energy lo...

Method of determining an energy width of a charged particle beam

Method, device and system for reducing off-axial aberration in elec...

Method of imaging a specimen using a transmission charged particle...

Electron optical module for providing an off-axial electron beam wi...

System and method for reducing the charging effect in a transmissio...

Method, device and system for reducing off-axial aberration in elec...

Magnetic field free sample plane for charged particle microscope

Sixth-order and above corrected STEM multipole correctors

Multi-electron-beam imaging apparatus with improved performance

Method and system for energy resolved chroma imaging

EELS detection technique in an electron microscope

Electron energy loss spectroscopy with adjustable energy resolution

Emission noise correction of a charged particle source

Post column filter with enhanced energy range

Gun lens design in a charged particle microscope

Transmission charged particle microscope with imaging beam rotation

Aberration measurement in a charged particle microscope

Spectroscopy in a transmission charged-particle microscope

Post column filter with enhanced energy range

Charged particle microscope with special aperture plate

Method of using an environmental transmission electron microscope

Method of performing spectroscopy in a transmission charged-particl...

Method of investigating and correcting aberrations in a charged-par...

Simultaneous electron detection

Method of preparing and imaging a lamella in a particle-optical app...

Method of use for a multipole detector for a transmission electron...

Patents Applicationslast 30 patents

TECHNIQUES FOR ELECTRON ENERGY LOSS SPECTROSCOPY AT HIGH ENERGY

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LO...

Detectors For Microscopy

EELS Auto-Alignment Using Full Image Simulation

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

SYSTEM FOR SENSOR PROTECTION IN ELECTRON IMAGING APPLICATIONS

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

ELECTRON OPTICAL MODULE FOR PROVIDING AN OFF-AXIAL ELECTRON BEAM WI...

SYSTEM AND METHOD FOR REDUCING THE CHARGING EFFECT IN A TRANSMISSIO...

ENERGY SPECTROMETER WITH DYNAMIC FOCUS

METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE

MAGNETIC FIELD FREE SAMPLE PLANE FOR CHARGED PARTICLE MICROSCOPE

METHOD OF DETERMINING AN ENERGY WIDTH OF A CHARGED PARTICLE BEAM

METHOD OF IMAGING A SPECIMEN USING A TRANSMISSION CHARGED PARTICLE...

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH AN ELECTRON ENERGY LO...

METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...

SIXTH-ORDER AND ABOVE CORRECTED STEM MULTIPOLE CORRECTORS

MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE

EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

ELECTRON ENERGY LOSS SPECTROSCOPY WITH ADJUSTABLE ENERGY RESOLUTION

GUN LENS DESIGN IN A CHARGED PARTICLE MICROSCOPE

ABERRATION MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

POST COLUMN FILTER WITH ENHANCED ENERGY RANGE

EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE

POST COLUMN FILTER WITH ENHANCED ENERGY RANGE

CHARGED PARTICLE MICROSCOPE WITH SPECIAL APERTURE PLATE

SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICLE MICROSCOPE

Method of performing spectroscopy in a Transmission Charged-Particl...