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Peter Clement Paul Vanoppen
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Hechtel-Eksel, BE
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Patents Grants
last 30 patents
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Patent Grant
Method for predicting a critical dimension of a feature imaged by a...
Patent number
7,443,486
Issue date
Oct 28, 2008
ASML Netherlands B.V.
Koen Van Ingen Schenau
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
Inspection Apparatus and Method, Lithographic Apparatus, Lithograph...
Publication number
20120206703
Publication date
Aug 16, 2012
ASML NETHERLANDS B.V.
Kaustuve BHATTACHARYYA
G01 - MEASURING TESTING
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Patent Application
Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...
Publication number
20120033223
Publication date
Feb 9, 2012
ASML NETHERLANDS B.V.
Christian Marinus Leewis
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
Method and Apparatus for Overlay Measurement
Publication number
20110141450
Publication date
Jun 16, 2011
ASML NETHERLANDS B.V.
Henricus Johannes Lambertus Megens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
Method of Determining a Characteristic
Publication number
20100165312
Publication date
Jul 1, 2010
ASML NETHERLANDS B.V.
Henricus Johannes Lambertus Megens
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY