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Peter Danny Van Voorst
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Nijmegen, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Wavefront sensor and associated metrology apparatus
Patent number
11,815,402
Issue date
Nov 14, 2023
ASML Netherlands B.V.
Sietse Thijmen Van Der Post
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and apparatus for deriving corrections, method and apparatus...
Patent number
11,243,470
Issue date
Feb 8, 2022
ASML Netherlands B.V.
Nitish Kumar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical system, metrology apparatus and associated method
Patent number
11,129,266
Issue date
Sep 21, 2021
ASML Netherlands B.V.
Peter Danny Van Voorst
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical systems, metrology apparatus and associated method
Patent number
10,725,381
Issue date
Jul 28, 2020
ASML Netherlands B.V.
Sietse Thijmen Van Der Post
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology apparatus for and a method of determining a characteristi...
Patent number
10,670,974
Issue date
Jun 2, 2020
ASML Netherlands B.V.
Gerrit Jacobus Hendrik Brussaard
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Illumination source for an inspection apparatus, inspection apparat...
Patent number
10,451,559
Issue date
Oct 22, 2019
ASML Netherlands B.V.
Peter Danny Van Voorst
G01 - MEASURING TESTING
Information
Patent Grant
Illumination source for an inspection apparatus, inspection apparat...
Patent number
10,330,606
Issue date
Jun 25, 2019
ASML Netherlands B.V.
Peter Danny Van Voorst
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for inspection and metrology
Patent number
10,185,224
Issue date
Jan 22, 2019
ASML Netherlands B.V.
Ferry Zijp
G02 - OPTICS
Information
Patent Grant
Method and apparatus for inspection and metrology
Patent number
9,811,001
Issue date
Nov 7, 2017
ASML Netherlands B.V.
Peter Danny Van Voorst
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
WAVEFRONT SENSOR AND ASSOCIATED METROLOGY APPARATUS
Publication number
20220099498
Publication date
Mar 31, 2022
ASML NETHERLANDS B.V.
Sietse Thijmen VAN DER POST
G02 - OPTICS
Information
Patent Application
Optical System, Metrology Apparatus and Associated Method
Publication number
20200100350
Publication date
Mar 26, 2020
ASML NETHERLANDS B.V.
Peter Danny VAN VOORST
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR DERIVING CORRECTIONS, METHOD AND APPARATUS...
Publication number
20190212660
Publication date
Jul 11, 2019
ASML NETHERLANDS B.V.
Nitish KUMAR
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Metrology Apparatus for and a Method of Determining a Characteristi...
Publication number
20190204757
Publication date
Jul 4, 2019
ASML NETHERLANDS B.V.
Gerrit Jacobus Hendrik BRUSSAARD
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Optical Systems, Metrology Apparatus and Associated Method
Publication number
20190072853
Publication date
Mar 7, 2019
ASML NETHERLANDS B.V.
Sietse Thijmen VAN DER POST
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Methods and Apparatus for Determining the Position of a Spot of Rad...
Publication number
20190049861
Publication date
Feb 14, 2019
ASML NETHERLANDS B.V.
Peter Danny VAN VOORST
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Illumination Source for an Inspection Apparatus, Inspection Apparat...
Publication number
20190003981
Publication date
Jan 3, 2019
ASML NETHERLANDS B.V.
Peter Danny Van Voorst
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
Publication number
20180120714
Publication date
May 3, 2018
ASML NETHERLANDS B.V.
Ferry Zijp
G02 - OPTICS
Information
Patent Application
Illumination Source for an Inspection Apparatus, Inspection Apparat...
Publication number
20180073992
Publication date
Mar 15, 2018
ASML NETHERLANDS B.V.
Peter Danny VAN VOORST
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
Publication number
20160266503
Publication date
Sep 15, 2016
ASML NETHERLANDS B.V.
Peter Danny Van Voorst
G02 - OPTICS