Peter de Wolf

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Eeklo, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 6,201,401
- Issue date Mar 13, 2001
- IMEC
- Louis C. Hellemans
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 6,091,248
- Issue date Jul 18, 2000
- IMEC vzw
- Louis C. Hellemans
- G01 - MEASURING TESTING
Information Patent Grant
Database and method for measurement correction for cross-sectional...
- Patent number 5,995,912
- Issue date Nov 30, 1999
- IMEC vzw
- Peter DeWolf
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring the electrical potential in a semiconductor el...
- Patent number 5,723,981
- Issue date Mar 3, 1998
- IMEC vzw
- Louis C. Hellemans
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for determining the resistance and carrier profile of a semi...
- Patent number 5,585,734
- Issue date Dec 17, 1996
- Interuniversitair Micro-Elektronica Centrum VZW
- Marc A. J. Meuris
- B82 - NANO-TECHNOLOGY