Peter DeGroot

Person

Bellevue, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interometric optical system
- Patent number 12,104,897
- Issue date Oct 1, 2024
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Metrology of multi-layer stacks
- Patent number 10,591,284
- Issue date Mar 17, 2020
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Surface topography apparatus and method
- Patent number 10,451,413
- Issue date Oct 22, 2019
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of scanning interferometers
- Patent number 9,958,254
- Issue date May 1, 2018
- Zygo Corporation
- Peter J. de Groot
- G02 - OPTICS
Information Patent Grant
Measuring topography of aspheric and other non-flat surfaces
- Patent number 9,798,130
- Issue date Oct 24, 2017
- Zygo Corporation
- Thomas Dresel
- G02 - OPTICS
Information Patent Grant
Double pass interferometric encoder system
- Patent number 9,746,348
- Issue date Aug 29, 2017
- Zygo Corporation
- Peter J. de Groot
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for determining information about a transparent o...
- Patent number 9,658,129
- Issue date May 23, 2017
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Optical evaluation of lenses and lens molds
- Patent number 9,599,534
- Issue date Mar 21, 2017
- Zygo Corporation
- Martin F. Fay
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry employing refractive index dispersion broadening of...
- Patent number 9,377,292
- Issue date Jun 28, 2016
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 9,140,537
- Issue date Sep 22, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry for lateral metrology
- Patent number 9,025,162
- Issue date May 5, 2015
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Double pass interferometric encoder system
- Patent number 9,025,161
- Issue date May 5, 2015
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoder systems
- Patent number 8,988,690
- Issue date Mar 24, 2015
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Double pass interferometric encoder system
- Patent number 8,941,842
- Issue date Jan 27, 2015
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence interferometry with scan error correction
- Patent number 8,902,431
- Issue date Dec 2, 2014
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 8,885,172
- Issue date Nov 11, 2014
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric methods for metrology of surfaces, films and underr...
- Patent number 8,854,628
- Issue date Oct 7, 2014
- Zygo Corporation
- Xavier M. Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Topographical profiling with coherence scanning interferometry
- Patent number 8,780,334
- Issue date Jul 15, 2014
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoder systems
- Patent number 8,670,127
- Issue date Mar 11, 2014
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Fiber-based interferometer system for monitoring an imaging interfe...
- Patent number 8,379,218
- Issue date Feb 19, 2013
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoder systems
- Patent number 8,300,233
- Issue date Oct 30, 2012
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for overlay measurements
- Patent number 8,248,617
- Issue date Aug 21, 2012
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for determining overlay errors
- Patent number 8,189,202
- Issue date May 29, 2012
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing surface structure using scanning interferometry
- Patent number 8,126,677
- Issue date Feb 28, 2012
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric systems and methods featuring spectral analysis of...
- Patent number 8,120,781
- Issue date Feb 21, 2012
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for interferometric analysis of surfaces and re...
- Patent number 8,107,085
- Issue date Jan 31, 2012
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric analysis of under-resolved features
- Patent number 8,072,611
- Issue date Dec 6, 2011
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Equal-path interferometer
- Patent number 8,045,175
- Issue date Oct 25, 2011
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Scan error correction in low coherence scanning interferometry
- Patent number 8,004,688
- Issue date Aug 23, 2011
- Zygo Corporation
- Mark Davidson
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer utilizing polarization scanning
- Patent number 7,978,337
- Issue date Jul 12, 2011
- Zygo Corporation
- Peter De Groot
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INTEROMETRIC OPTICAL SYSTEM
- Publication number 20240053143
- Publication date Feb 15, 2024
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY OF MULTI-LAYER STACKS
- Publication number 20190265023
- Publication date Aug 29, 2019
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TOPOGRAPHY APPARATUS AND METHOD
- Publication number 20180180412
- Publication date Jun 28, 2018
- Zygo Corporation
- Peter J. de Groot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION OF SCANNING INTERFEROMETERS
- Publication number 20160047645
- Publication date Feb 18, 2016
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EVALUATION OF LENSES AND LENS MOLDS
- Publication number 20160047711
- Publication date Feb 18, 2016
- Zygo Corporation
- Martin F. Fay
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL EVALUATION OF LENSES AND LENS MOLDS
- Publication number 20160047712
- Publication date Feb 18, 2016
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM
- Publication number 20150292913
- Publication date Oct 15, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
Measuring Topography of Aspheric and Other Non-Flat Surfaces
- Publication number 20150192769
- Publication date Jul 9, 2015
- Zygo Corporation
- Thomas Dresel
- G02 - OPTICS
Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20150043005
- Publication date Feb 12, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY EMPLOYING REFRACTIVE INDEX DISPERSION
- Publication number 20150043006
- Publication date Feb 12, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
COHERENCE SCANNING INTERFEROMETRY USING PHASE SHIFTED INTERFEROMETR...
- Publication number 20150002852
- Publication date Jan 1, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODER SYSTEMS
- Publication number 20140049782
- Publication date Feb 20, 2014
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION
- Publication number 20130155413
- Publication date Jun 20, 2013
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM
- Publication number 20130114061
- Publication date May 9, 2013
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20120194824
- Publication date Aug 2, 2012
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODER SYSTEMS
- Publication number 20120170048
- Publication date Jul 5, 2012
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UND...
- Publication number 20120089365
- Publication date Apr 12, 2012
- Zygo Corporation
- Martin Fay
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERR...
- Publication number 20120069326
- Publication date Mar 22, 2012
- Zygo Corporation
- Xavier M. Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODER SYSTEMS
- Publication number 20110255096
- Publication date Oct 20, 2011
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER FOR DETERMINING OVERLAY ERRORS
- Publication number 20110032535
- Publication date Feb 10, 2011
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
Equal-Path Interferometer
- Publication number 20110007323
- Publication date Jan 13, 2011
- Zygo Corporation
- Peter J. De Groot
- G02 - OPTICS
Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20100265516
- Publication date Oct 21, 2010
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
ERROR COMPENSATION IN PHASE SHIFTING INTERFEROMETRY
- Publication number 20100238455
- Publication date Sep 23, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
COMPOUND REFERENCE INTERFEROMETER
- Publication number 20100128276
- Publication date May 27, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
FIBER-BASED INTERFEROMETER SYSTEM FOR MONITORING AN IMAGING INTERFE...
- Publication number 20100128278
- Publication date May 27, 2010
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
SCAN ERROR CORRECTION IN LOW COHERENCE SCANNING INTERFEROMETRY
- Publication number 20100128280
- Publication date May 27, 2010
- Zygo Corporation
- Mark Davidson
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEMS AND METHODS FEATURING SPECTRAL ANALYSIS OF...
- Publication number 20100128283
- Publication date May 27, 2010
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT
- Publication number 20100091296
- Publication date Apr 15, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR INTERFEROMETRIC ANALYSIS OF SURFACES AND RE...
- Publication number 20100060898
- Publication date Mar 11, 2010
- PETER J. DE GROOT
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR LATERAL METROLOGY
- Publication number 20090303493
- Publication date Dec 10, 2009
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING

Peter DeGroot

Person

Patents Grantslast 30 patents

Interometric optical system

Metrology of multi-layer stacks

Surface topography apparatus and method

Calibration of scanning interferometers

Measuring topography of aspheric and other non-flat surfaces

Double pass interferometric encoder system

Method and system for determining information about a transparent o...

Optical evaluation of lenses and lens molds

Interferometry employing refractive index dispersion broadening of...

Interferometric heterodyne optical encoder system

Interferometry for lateral metrology

Double pass interferometric encoder system

Interferometric encoder systems

Double pass interferometric encoder system

Low coherence interferometry with scan error correction

Interferometric heterodyne optical encoder system

Interferometric methods for metrology of surfaces, films and underr...

Topographical profiling with coherence scanning interferometry

Interferometric encoder systems

Fiber-based interferometer system for monitoring an imaging interfe...

Interferometric encoder systems

Interferometer for overlay measurements

Interferometer for determining overlay errors

Analyzing surface structure using scanning interferometry

Interferometric systems and methods featuring spectral analysis of...

Methods and systems for interferometric analysis of surfaces and re...

Interferometric analysis of under-resolved features

Equal-path interferometer

Scan error correction in low coherence scanning interferometry

Interferometer utilizing polarization scanning

Patents Applicationslast 30 patents

INTEROMETRIC OPTICAL SYSTEM

METROLOGY OF MULTI-LAYER STACKS

SURFACE TOPOGRAPHY APPARATUS AND METHOD

CALIBRATION OF SCANNING INTERFEROMETERS

OPTICAL EVALUATION OF LENSES AND LENS MOLDS

OPTICAL EVALUATION OF LENSES AND LENS MOLDS

DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM

Measuring Topography of Aspheric and Other Non-Flat Surfaces

INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM

INTERFEROMETRY EMPLOYING REFRACTIVE INDEX DISPERSION

COHERENCE SCANNING INTERFEROMETRY USING PHASE SHIFTED INTERFEROMETR...

INTERFEROMETRIC ENCODER SYSTEMS

LOW COHERENCE INTERFEROMETRY WITH SCAN ERROR CORRECTION

DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM

INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM

INTERFEROMETRIC ENCODER SYSTEMS

DATA INTERPOLATION METHODS FOR METROLOGY OF SURFACES, FILMS AND UND...

INTERFEROMETRIC METHODS FOR METROLOGY OF SURFACES, FILMS AND UNDERR...

INTERFEROMETRIC ENCODER SYSTEMS

INTERFEROMETER FOR DETERMINING OVERLAY ERRORS

Equal-Path Interferometer

INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...

ERROR COMPENSATION IN PHASE SHIFTING INTERFEROMETRY

COMPOUND REFERENCE INTERFEROMETER

FIBER-BASED INTERFEROMETER SYSTEM FOR MONITORING AN IMAGING INTERFE...

SCAN ERROR CORRECTION IN LOW COHERENCE SCANNING INTERFEROMETRY

INTERFEROMETRIC SYSTEMS AND METHODS FEATURING SPECTRAL ANALYSIS OF...

INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT

METHODS AND SYSTEMS FOR INTERFEROMETRIC ANALYSIS OF SURFACES AND RE...

INTERFEROMETRY FOR LATERAL METROLOGY