Peter Domenicali

Person

Montepelier, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor material characterizing method and apparatus
- Patent number 6,163,163
- Issue date Dec 19, 2000
- Semitest, Inc.
- Charles M. Kohn
Information Patent Grant
Method and apparatus for characterizing a specimen of semiconductor...
- Patent number 6,097,205
- Issue date Aug 1, 2000
- Semitest, Inc.
- Sergey Liberman
- G01 - MEASURING TESTING
Information Patent Grant
Method utilizing a modulated light beam for determining characteris...
- Patent number 6,034,535
- Issue date Mar 7, 2000
- Semitest Inc.
- Sergey Liberman
- G01 - MEASURING TESTING
Information Patent Grant
Tilt free micromotion translator
- Patent number 5,721,616
- Issue date Feb 24, 1998
- Zygo Corporation
- Peter Domenicali
- G02 - OPTICS
Information Patent Grant
Wafer testing and self-calibration system
- Patent number 5,642,298
- Issue date Jun 24, 1997
- ADE Corporation
- Roy E. Mallory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer handling and processing system
- Patent number 5,511,005
- Issue date Apr 23, 1996
- ADE Corporation
- Robert C. Abbe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Proximity mask alignment using a stored video image
- Patent number 5,204,739
- Issue date Apr 20, 1993
- Karl Suss America, Inc.
- Peter L. Domenicali
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical interferometer system with CCTV camera for measuring a wide...
- Patent number 4,201,473
- Issue date May 6, 1980
- Zygo Corporation
- Peter L. Domenicali
- G01 - MEASURING TESTING

Peter Domenicali

Person

Patents Grantslast 30 patents

Semiconductor material characterizing method and apparatus

Method and apparatus for characterizing a specimen of semiconductor...

Method utilizing a modulated light beam for determining characteris...

Tilt free micromotion translator

Wafer testing and self-calibration system

Wafer handling and processing system

Proximity mask alignment using a stored video image

Optical interferometer system with CCTV camera for measuring a wide...