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Peter F. Ebbing
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Los Altos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
On the fly center-finding during substrate handling in a processing...
Patent number
6,198,976
Issue date
Mar 6, 2001
Applied Materials, Inc.
Satish Sundar
G05 - CONTROLLING REGULATING
Information
Patent Grant
Substrate clamping apparatus
Patent number
6,155,773
Issue date
Dec 5, 2000
Applied Materials, Inc.
Peter F. Ebbing
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for normalizing a laser beam to a reflective s...
Patent number
5,648,847
Issue date
Jul 15, 1997
Applied Materials, Inc.
Peter Ebbing
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Electrically heated fluid carrying conduit having integrated heatin...
Patent number
5,544,275
Issue date
Aug 6, 1996
Applied Materials, Inc.
Peter F. Ebbing
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Method and dry vapor generator channel assembly for conveying a liq...
Patent number
5,537,508
Issue date
Jul 16, 1996
Applied Materials, Inc.
Peter F. Ebbing
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Pneumatic circuit to provide different opening and closing speeds f...
Patent number
5,465,746
Issue date
Nov 14, 1995
Applied Materials, Inc.
Peter F. Ebbing
F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information
Patent Grant
Etch rate monitor using collimated light and method of using same
Patent number
5,337,144
Issue date
Aug 9, 1994
Applied Materials, Inc.
Bruno Strul
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reducing particulate generation caused by...
Patent number
5,263,518
Issue date
Nov 23, 1993
Applied Materials, Inc.
Peter Ebbing
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Magnetic semiconductor wafers with handling apparatus and method
Patent number
5,224,581
Issue date
Jul 6, 1993
Applied Materials, Inc.
Peter Ebbing
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for reducing particulate generation caused by...
Patent number
5,219,007
Issue date
Jun 15, 1993
Applied Materials, Inc.
Peter Ebbing
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method and apparatus for endpoint detection in a semiconductor wafe...
Patent number
5,151,584
Issue date
Sep 29, 1992
Applied Materials, Inc.
Peter Ebbing
B24 - GRINDING POLISHING
Information
Patent Grant
Method of handling magnetic semiconductor wafers
Patent number
5,147,828
Issue date
Sep 15, 1992
Applied Materials, Inc.
Peter Ebbing
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus to inhibit obstruction of optical transmission...
Patent number
5,129,994
Issue date
Jul 14, 1992
Applied Materials, Inc.
Peter F. Ebbing
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for endpoint detection in a semiconductor wafe...
Patent number
5,077,464
Issue date
Dec 31, 1991
Applied Materials, Inc.
Peter Ebbing
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for endpoint detection in a semiconductor wafe...
Patent number
4,953,982
Issue date
Sep 4, 1990
Applied Materials, Inc.
Peter Ebbing
G02 - OPTICS
Information
Patent Grant
Method of aligning wafers and device therefor
Patent number
4,813,840
Issue date
Mar 21, 1989
Applied Materials, Inc.
Rakesh Prabhakar
H01 - BASIC ELECTRIC ELEMENTS