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Peter G. Eldredge
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Santa Clara, CA, US
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last 30 patents
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Patent Grant
Automatic system and method for inspecting hole quality
Patent number
4,555,798
Issue date
Nov 26, 1985
KLA Instruments Corporation
William H. Broadbent
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Automatic photomask inspection method and system
Patent number
4,448,532
Issue date
May 15, 1984
KLA Instruments Corporation
David A. Joseph
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY