Peter Gnauck

Follow

Person

Reutlingen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Detector for variable pressure areas and an electron microscope com...
- Patent number 7,462,839
- Issue date Dec 9, 2008
- Carl Zeiss NTS GmbH
- Peter Gnauck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device with a particle source to be operated in high...
- Patent number 6,872,956
- Issue date Mar 29, 2005
- Carl Zeiss NTS GmbH
- Peter Gnauck
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Objective lens for an electron microscopy system and electron micro...
- Patent number 6,855,938
- Issue date Feb 15, 2005
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process and device for ion thinning in a high resolution transmissi...
- Patent number 6,218,663
- Issue date Apr 17, 2001
- NMI Naturwissenschaftliches und Medizinisches
- Wilfried Nisch
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Detector for variable pressure areas and an electron microscope com...
- Publication number 20050173644
- Publication date Aug 11, 2005
- Peter Gnauck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Objective lens for an electron microscopy system and electron micro...
- Publication number 20040084629
- Publication date May 6, 2004
- LEO Elektronenmikroskopie GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle beam device with a particle source to be operated in high...
- Publication number 20040076529
- Publication date Apr 22, 2004
- Peter Gnauck
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...