Peter Gunderson

Person

Ellsworth, WI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of separating one or more substrates that are adhesively bo...
- Patent number 11,037,593
- Issue date Jun 15, 2021
- Seagate Technology LLC
- Ruhai Tian
- B32 - LAYERED PRODUCTS
Information Patent Grant
Transducer bar translation system and method of translating a trans...
- Patent number 10,319,396
- Issue date Jun 11, 2019
- Seagate Technology LLC
- Glenn Johnson
- G11 - INFORMATION STORAGE
Information Patent Grant
High flow packaging for slider cleaning
- Patent number 10,147,448
- Issue date Dec 4, 2018
- Seagate Technology LLC
- Lijuan Zhong
- G11 - INFORMATION STORAGE
Information Patent Grant
Accuracy and precision in raman spectroscopy
- Patent number 9,689,743
- Issue date Jun 27, 2017
- Seagate Technology LLC
- Huiwen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Process to inhibit slider contamination during processing
- Patent number 9,685,176
- Issue date Jun 20, 2017
- Seagate Technology LLC
- Vince B. Engelkes
- G11 - INFORMATION STORAGE
Information Patent Grant
Semi-auto scanning probe microscopy scanning
- Patent number 9,586,817
- Issue date Mar 7, 2017
- Seagate Technology LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and devices for correcting errors in atomic force microscopy
- Patent number 9,527,732
- Issue date Dec 27, 2016
- Seagate Technology LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Variable pixel density imaging
- Patent number 8,525,112
- Issue date Sep 3, 2013
- Seagate Technology LLC
- Lin Zhou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscopy employing correlation pattern recognition
- Patent number 8,371,155
- Issue date Feb 12, 2013
- Seagate Technology LLC
- Lin Zhou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy true shape measurement method
- Patent number 8,296,860
- Issue date Oct 23, 2012
- Seagate Technology LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TRANSDUCER BAR TRANSLATION SYSTEM
- Publication number 20170365284
- Publication date Dec 21, 2017
- SEAGATE TECHNOLOGY LLC
- Glenn Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
HIGH FLOW PACKAGING FOR SLIDER CLEANING
- Publication number 20160012835
- Publication date Jan 14, 2016
- SEAGATE TECHNOLOGY LLC
- Lijuan Zhong
- B08 - CLEANING
Information Patent Application
PROCESS TO INHIBIT SLIDER CONTAMINATION DURING PROCESSING
- Publication number 20150020379
- Publication date Jan 22, 2015
- SEAGATE TECHNOLOGY LLC
- Vince B. Engelkes
- G11 - INFORMATION STORAGE
Information Patent Application
ACCURACY AND PRECISION IN RAMAN SPECTROSCOPY
- Publication number 20140028996
- Publication date Jan 30, 2014
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- G01 - MEASURING TESTING
Information Patent Application
ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE
- Publication number 20130081159
- Publication date Mar 28, 2013
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
SEMI-AUTO SCANNING PROBE MICROSCOPY SCANNING
- Publication number 20130031680
- Publication date Jan 31, 2013
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY
- Publication number 20120079635
- Publication date Mar 29, 2012
- SEAGATE TECHNOLOGY LLC
- Huiwen Liu
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE PIXEL DENSITY IMAGING
- Publication number 20120042422
- Publication date Feb 16, 2012
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPY EMPLOYING CORRELATION PATTERN RECOGNITION
- Publication number 20110138505
- Publication date Jun 9, 2011
- Seagate Technology LLC
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPY TRUE SHAPE MEASUREMENT METHOD
- Publication number 20100235956
- Publication date Sep 16, 2010
- Seagate Technology LLC
- Huiwen Liu
- G01 - MEASURING TESTING

Peter Gunderson

Person

Patents Grantslast 30 patents

Methods of separating one or more substrates that are adhesively bo...

Transducer bar translation system and method of translating a trans...

High flow packaging for slider cleaning

Accuracy and precision in raman spectroscopy

Process to inhibit slider contamination during processing

Semi-auto scanning probe microscopy scanning

Methods and devices for correcting errors in atomic force microscopy

Variable pixel density imaging

Scanning probe microscopy employing correlation pattern recognition

Atomic force microscopy true shape measurement method

Patents Applicationslast 30 patents

TRANSDUCER BAR TRANSLATION SYSTEM

HIGH FLOW PACKAGING FOR SLIDER CLEANING

PROCESS TO INHIBIT SLIDER CONTAMINATION DURING PROCESSING

ACCURACY AND PRECISION IN RAMAN SPECTROSCOPY

ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE

SEMI-AUTO SCANNING PROBE MICROSCOPY SCANNING

METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY

VARIABLE PIXEL DENSITY IMAGING

SCANNING PROBE MICROSCOPY EMPLOYING CORRELATION PATTERN RECOGNITION

ATOMIC FORCE MICROSCOPY TRUE SHAPE MEASUREMENT METHOD