Peter H. Decher

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Lake Oswego, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for flexible extension of electrical conducto...
- Patent number 7,572,132
- Issue date Aug 11, 2009
- Advanced Inquiry Systems, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Tester architecture for testing semiconductor integrated circuits
- Patent number 6,956,394
- Issue date Oct 18, 2005
- Teseda Corporation
- Ajit M. Limaye
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and apparatus for flexible extension of electrical conducto...
- Publication number 20080248663
- Publication date Oct 9, 2008
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Tester architecture for testing semiconductor integrated circuits
- Publication number 20040232936
- Publication date Nov 25, 2004
- Teseda Corporation
- Ajit M. Limaye
- G01 - MEASURING TESTING