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Peter H. Heinz
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Trumbull, CT, US
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last 30 patents
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Patent Grant
Kinetic analyzer
Patent number
4,052,161
Issue date
Oct 4, 1977
The Perkin-Elmer Corporation
John G. Atwood
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for computation in a kinetic analyzer
Patent number
3,963,909
Issue date
Jun 15, 1976
The Perkin-Elmer Corporation
John G. Atwood
G01 - MEASURING TESTING