Peter H. Mui

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Fairfax, VA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical information collection system
- Patent number 10,948,341
- Issue date Mar 16, 2021
- Northrop Grumman Systems Corporation
- Thomas Edmund Petty
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase front measurement unit
- Patent number 6,674,519
- Issue date Jan 6, 2004
- Northrop Grumman Corporation
- Peter H. Mui
- G01 - MEASURING TESTING
Information Patent Grant
Line periodically poled LiNbO.sub.3 (PPLN) optical parametric oscil...
- Patent number 6,101,023
- Issue date Aug 8, 2000
- Northrop Grumman Corporation
- Ronald K. Meyer
- G02 - OPTICS
Information Patent Grant
Quadruple grating period PPLN optical parametric oscillator differe...
- Patent number 6,016,214
- Issue date Jan 18, 2000
- Northrop Grumman Corporation
- Ronald K. Meyer
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INFORMATION COLLECTION SYSTEM
- Publication number 20200249080
- Publication date Aug 6, 2020
- Northrop Grumman Systems Corporation
- THOMAS EDMUND PETTY
- G01 - MEASURING TESTING
Information Patent Application
Optical phase front measurement unit
- Publication number 20030117615
- Publication date Jun 26, 2003
- Peter H. Mui
- G02 - OPTICS