Peter Hoffrogge

Person

Oberkochen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Material processing system and method
- Patent number 7,868,290
- Issue date Jan 11, 2011
- Carl Zeiss NTS GmbH
- Hans W. P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material processing system and method
- Patent number 7,435,973
- Issue date Oct 14, 2008
- Carl Zeiss NTS GmbH
- Hans W. P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device
- Patent number 7,109,487
- Issue date Sep 19, 2006
- Carl Zeiss NTS GmbH
- Martin Kienle
- G01 - MEASURING TESTING
Information Patent Grant
Objective lens for an electron microscopy system and electron micro...
- Patent number 6,855,938
- Issue date Feb 15, 2005
- Carl Zeiss NTS GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER CHUCK FOR HANDLING A WAFER
- Publication number 20220328341
- Publication date Oct 13, 2022
- PVA TePla Analytical Systems GmbH
- Peter HOFFROGGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ultrasonic Microscope and Carrier for carrying an acoustic Pulse Tr...
- Publication number 20190361103
- Publication date Nov 28, 2019
- PVA TePla Analytical Systems GmbH
- Peter Hoffrogge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material processing system and method
- Publication number 20090121132
- Publication date May 14, 2009
- CARL ZEISS NTS GMBH
- Hans W.P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Material processing system and method
- Publication number 20060284090
- Publication date Dec 21, 2006
- CARL ZEISS NTS GMBH
- Hans W.P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrangement for the production of photomasks
- Publication number 20060154150
- Publication date Jul 13, 2006
- Thomas Engel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Particle beam device
- Publication number 20050116165
- Publication date Jun 2, 2005
- Martin Kienle
- G01 - MEASURING TESTING
Information Patent Application
Material processing system and method
- Publication number 20050103272
- Publication date May 19, 2005
- LEO Elektronenmikroskopie GmbH
- Hans W.P. Koops
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Objective lens for an electron microscopy system and electron micro...
- Publication number 20040084629
- Publication date May 6, 2004
- LEO Elektronenmikroskopie GmbH
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS

Peter Hoffrogge

Person

Patents Grantslast 30 patents

Material processing system and method

Material processing system and method

Particle beam device

Objective lens for an electron microscopy system and electron micro...

Patents Applicationslast 30 patents

WAFER CHUCK FOR HANDLING A WAFER

Ultrasonic Microscope and Carrier for carrying an acoustic Pulse Tr...

Material processing system and method

Material processing system and method

Arrangement for the production of photomasks

Particle beam device

Material processing system and method

Objective lens for an electron microscopy system and electron micro...