Peter Hofmann

Follow

Person

Radeberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating a field-effect transistor
- Patent number 11,545,569
- Issue date Jan 3, 2023
- X-FAB SEMICONDUCTOR FOUNDRIES GMBH
- Manoj Chandrika Reghunathan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of fabricating field-effect transistors
- Patent number 11,152,504
- Issue date Oct 19, 2021
- X-FAB SEMICONDUCTOR FOUNDRIES GMBH
- Manoj Chandrika Reghunathan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermopile test structure and methods employing same
- Patent number 10,502,631
- Issue date Dec 10, 2019
- X-FAB SEMICONDUCTOR FOUNDRIES GMBH
- Peter Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Vertical hall sensors with reduced offset error
- Patent number 9,543,504
- Issue date Jan 10, 2017
- MELEXIS TECHNOLOGIES NV
- Christian Schott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical hall sensor and method for producing a vertical hall sensor
- Patent number 8,564,083
- Issue date Oct 22, 2013
- Melexis Technologies NV
- Christian Schott
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF FABRICATING A FIELD-EFFECT TRANSISTOR
- Publication number 20210013340
- Publication date Jan 14, 2021
- X-FAB SEMICONDUCTOR FOUNDRIES GmbH
- Manoj Chandrika Reghunathan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FABRICATING FIELD-EFFECT TRANSISTORS
- Publication number 20180350979
- Publication date Dec 6, 2018
- X-FAB SEMICONDUCTOR FOUNDRIES AG.
- Manoj Chandrika Reghunathan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMOPILE TEST STRUCTURE AND METHODS EMPLOYING SAME
- Publication number 20170363477
- Publication date Dec 21, 2017
- X-FAB SEMICONDUCTOR FOUNDRIES AG.
- Peter HOFMANN
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL HALL SENSORS WITH REDUCED OFFSET ERROR
- Publication number 20160111631
- Publication date Apr 21, 2016
- MELEXIS TECHNOLOGIES NV
- Christian Schott
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL HALL SENSOR AND METHOD FOR PRODUCING A VERTICAL HALL SENSOR
- Publication number 20120241887
- Publication date Sep 27, 2012
- X-FAB SEMICONDUCTOR FOUNDRIES AG.
- Christian Schott
- G01 - MEASURING TESTING