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Peter J. De Groot
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Middletown, CT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Interferometer system for monitoring an object
Patent number
7,639,367
Issue date
Dec 29, 2009
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Grant
Height scanning interferometry method and apparatus including phase...
Patent number
6,775,006
Issue date
Aug 10, 2004
Zygo Corporation
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Grant
Height scanning interferometer for determining the absolute positio...
Patent number
6,597,460
Issue date
Jul 22, 2003
Zygo Corporation
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for profiling objects having multiple reflective...
Patent number
6,359,692
Issue date
Mar 19, 2002
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...
Publication number
20100134786
Publication date
Jun 3, 2010
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRIC ANALYSIS OF UNDER-RESOLVED FEATURES
Publication number
20090147268
Publication date
Jun 11, 2009
Zygo Corporation
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
Publication number
20080266574
Publication date
Oct 30, 2008
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRY FOR LATERAL METROLOGY
Publication number
20080180685
Publication date
Jul 31, 2008
Zygo Corporation
XAVIER COLONNA DE LEGA
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETER SYSTEM FOR MONITORING AN OBJECT
Publication number
20080165347
Publication date
Jul 10, 2008
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Application
COMPENSATION OF SYSTEMATIC EFFECTS IN LOW COHERENCE INTERFEROMETRY
Publication number
20080018901
Publication date
Jan 24, 2008
Zygo Corporation
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Application
Interferometry systems and methods
Publication number
20060187465
Publication date
Aug 24, 2006
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Application
Interferometry systems and methods
Publication number
20050200856
Publication date
Sep 15, 2005
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Application
Phase gap analysis for scanning interferometry
Publication number
20040027585
Publication date
Feb 12, 2004
Peter J. De Groot
G01 - MEASURING TESTING
Information
Patent Application
Interferometer having a coupled cavity geometry for use with an ext...
Publication number
20040012791
Publication date
Jan 22, 2004
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
Interferometry method and apparatus for producing lateral metrology...
Publication number
20030197871
Publication date
Oct 23, 2003
Peter J. De Groot
G01 - MEASURING TESTING
Information
Patent Application
Interferometer and method for measuring the refractive index and op...
Publication number
20020140946
Publication date
Oct 3, 2002
Peter de Groot
G01 - MEASURING TESTING
Information
Patent Application
Interferometer and method for measuring the refractive index and op...
Publication number
20020131053
Publication date
Sep 19, 2002
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Application
Optical systems for measuring form and geometric dimensions of prec...
Publication number
20010043333
Publication date
Nov 22, 2001
Peter De Groot
G01 - MEASURING TESTING
Information
Patent Application
Apparatus to transform two nonparallel propagating optical beam com...
Publication number
20010028461
Publication date
Oct 11, 2001
Zygo Corporation, a Delaware corporation
Henry A. Hill
G01 - MEASURING TESTING