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Peter J. Katzin
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Arlington, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Matching circuit for integrated circuit die
Patent number
11,424,196
Issue date
Aug 23, 2022
Analog Devices, Inc.
John C. Mahon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and methods for power enhancement of self-biased distribu...
Patent number
10,014,826
Issue date
Jul 3, 2018
Analog Devices, Inc.
Peter J. Katzin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Single-ended mixer with reduced loss
Patent number
9,602,055
Issue date
Mar 21, 2017
Analog Devices Global
Omar Fathy M. Haridy
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Apparatus and methods for reducing glitches in digital step attenua...
Patent number
9,548,722
Issue date
Jan 17, 2017
Analog Devices Global
Yusuf Alperen Atesal
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated switch module
Patent number
9,252,767
Issue date
Feb 2, 2016
Hittite Microwave Corporation
Kasim Ayyildiz
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
RF detector with crest factor measurement
Patent number
8,648,588
Issue date
Feb 11, 2014
Hittite Microwave Corporation
Yalcin Alper Eken
G01 - MEASURING TESTING
Information
Patent Grant
Logarithmic mean-square power detector
Patent number
8,581,574
Issue date
Nov 12, 2013
Hittite Microwave Corporation
Yalcin A. Eken
G01 - MEASURING TESTING
Information
Patent Grant
Active bias control circuit for an amplifier and method of power up...
Patent number
8,319,559
Issue date
Nov 27, 2012
Hittite Microwave Corporation
Fatih Kocer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Switched active bias control and power-on sequencing circuit for an...
Patent number
8,319,560
Issue date
Nov 27, 2012
Hittite Microwave Corporation
Fatih Kocer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
RF detector with crest factor measurement
Patent number
7,944,196
Issue date
May 17, 2011
Hittite Microwave Corporation
Yalcin Alper Eken
G01 - MEASURING TESTING
Information
Patent Grant
RF detector with crest factor measurement
Patent number
7,659,707
Issue date
Feb 9, 2010
Hittite Microwave Corporation
Yalcin Alper Eken
G01 - MEASURING TESTING
Information
Patent Grant
Stepped gain controlled RF driver amplifier in CMOS
Patent number
6,400,227
Issue date
Jun 4, 2002
Analog Devices, Inc.
Marc Goldfarb
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Post launch on-board identification friend or foe system
Patent number
5,796,362
Issue date
Aug 18, 1998
Hittite Microwave Corporation
Yalcin Ayasli
G01 - MEASURING TESTING
Information
Patent Grant
Active filter resonator and system and negative resistance generato...
Patent number
5,451,915
Issue date
Sep 19, 1995
Hittite Microwave Corporation
Peter J. Katzin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High-power rf switching system
Patent number
5,012,123
Issue date
Apr 30, 1991
Hittite Microwave, Inc.
Yalcin Ayasli
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
MATCHING CIRCUIT FOR INTEGRATED CIRCUIT DIE
Publication number
20190371746
Publication date
Dec 5, 2019
Analog Devices, Inc.
John C. Mahon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHODS FOR POWER ENHANCEMENT OF SELF-BIASED DISTRIBU...
Publication number
20170170787
Publication date
Jun 15, 2017
Analog Devices, Inc.
Peter J. Katzin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
APPARATUS AND METHODS FOR REDUCING GLITCHES IN DIGITAL STEP ATTENUA...
Publication number
20160118959
Publication date
Apr 28, 2016
ANALOG DEVICES GLOBAL
Yusuf Alperen Atesal
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
LOGARITHMIC MEAN-SQUARE POWER DETECTOR
Publication number
20140152295
Publication date
Jun 5, 2014
HITTITE MICROWAVE CORPORATION
Yalcin Alper Eken
G01 - MEASURING TESTING
Information
Patent Application
RF DETECTOR WITH CREST FACTOR MEASUREMENT
Publication number
20120013405
Publication date
Jan 19, 2012
Hittile Microwave Corporation
Yalcin Alper Eken
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
LOGARITHMIC MEAN-SQUARE POWER DETECTOR
Publication number
20110193550
Publication date
Aug 11, 2011
HITTITE MICROWAVE CORPORATION
Yalcin A. Eken
G01 - MEASURING TESTING
Information
Patent Application
Switched active bias control and power-on sequencing circuit for an...
Publication number
20110090014
Publication date
Apr 21, 2011
Fatih Kocer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Active bias control circuit for an amplifier and method of power up...
Publication number
20110084767
Publication date
Apr 14, 2011
Fatih Kocer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
RF DETECTOR WITH CREST FACTOR MEASUREMENT
Publication number
20100097143
Publication date
Apr 22, 2010
HITTITE MICROWAVE CORPORATION
Yalcin Alper Eken
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
RF detector with crest factor measurement
Publication number
20080297256
Publication date
Dec 4, 2008
Yalcin Alper Eken
H03 - BASIC ELECTRONIC CIRCUITRY