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Peter K. Charvat
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Portland, OR, US
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last 30 patents
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Patent Grant
Method of patterning a layer for a gate electrode of a MOS transistor
Patent number
6,191,016
Issue date
Feb 20, 2001
Intel Corporation
Robert S. Chau
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Via hole profile and method of fabrication
Patent number
5,874,358
Issue date
Feb 23, 1999
Intel Corporation
Alan M. Myers
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Anchored via connection
Patent number
5,619,071
Issue date
Apr 8, 1997
Intel Corporation
Alan M. Myers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for etching silicon oxide films in a reactive ion etch syste...
Patent number
5,549,784
Issue date
Aug 27, 1996
Intel Corporation
Kevin F. Carmody
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Via hole profile and method of fabrication
Patent number
5,470,790
Issue date
Nov 28, 1995
Intel Corporation
Alan M. Myers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Polyimide process for protecting integrated circuits
Patent number
5,242,864
Issue date
Sep 7, 1993
Intel Corporation
Maxine Fassberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High CF.sub.4 flow-reactive ion etch for aluminum patterning
Patent number
5,202,291
Issue date
Apr 13, 1993
Intel Corporation
Peter K. Charvat
H01 - BASIC ELECTRIC ELEMENTS