Peter M. KOPALIDIS

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Ion source of an ion implanter
- Patent number 9,852,887
- Issue date Dec 26, 2017
- Advanced Ion Beam Technology, Inc.
- Stephen Edward Savas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for measuring ion beam current
- Patent number 8,890,506
- Issue date Nov 18, 2014
- Advanced Ion Beam Technology, Inc.
- Peter M Kopalidis
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring ion beam current
- Patent number 8,653,807
- Issue date Feb 18, 2014
- Advanced Ion Beam Technology, Inc.
- Peter M Kopalidis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION SOURCE OF AN ION IMPLANTER
- Publication number 20150056380
- Publication date Feb 26, 2015
- ADVANCED ION BEAM TECHNOLOGY., INC.
- Stephen Edward Savas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ION BEAM CURRENT
- Publication number 20130057250
- Publication date Mar 7, 2013
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Peter M. KOPALIDIS
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ION BEAM CURRENT
- Publication number 20120019257
- Publication date Jan 26, 2012
- ADVANCED ION BEAM TECHNOLOGY, INC.
- PETER M. KOPALIDIS
- G01 - MEASURING TESTING