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Peter Michel Noel Vandenabeele
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Lier, BE
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last 30 patents
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Patent Grant
Integrated wafer temperature sensors
Patent number
6,325,536
Issue date
Dec 4, 2001
SensArray Corporation
Wayne Glenn Renken
G01 - MEASURING TESTING
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Patent Grant
Temperature calibration substrate
Patent number
5,967,661
Issue date
Oct 19, 1999
SensArray Corporation
Wayne Glenn Renken
G01 - MEASURING TESTING