Peter Poechmueller

Person

Colchester, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test data generator
- Patent number 6,865,707
- Issue date Mar 8, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 6,744,272
- Issue date Jun 1, 2004
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for recognizing and replacing defective memory cells in a me...
- Patent number 6,674,674
- Issue date Jan 6, 2004
- Infineon Technologies AG
- Peter Poechmueller
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for testing a circuit
- Patent number 6,618,305
- Issue date Sep 9, 2003
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated memory having memory cells with a magnetoresistive stora...
- Patent number 6,504,751
- Issue date Jan 7, 2003
- Infineon Technologies AG
- Peter Poechmueller
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated memory having memory cells with a magnetoresistive stora...
- Patent number 6,477,081
- Issue date Nov 5, 2002
- Infineon Technologies AG
- Peter Poechmueller
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Memory and method for replacing defective memory cells in the same
- Publication number 20030012066
- Publication date Jan 16, 2003
- Peter Poechmueller
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit for testing a synchronous circuit
- Publication number 20030005389
- Publication date Jan 2, 2003
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Method for recognizing and replacing defective memory cells in a me...
- Publication number 20020196686
- Publication date Dec 26, 2002
- Peter Poechmueller
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit for testing a circuit
- Publication number 20020196688
- Publication date Dec 26, 2002
- Infineon Technologies AG
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Test circuit
- Publication number 20020171447
- Publication date Nov 21, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Test data generator
- Publication number 20020157052
- Publication date Oct 24, 2002
- Infineon Technologies AG
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Integrated memory having memory cells with a magnetoresistive stora...
- Publication number 20020006061
- Publication date Jan 17, 2002
- Peter Poechmueller
- G11 - INFORMATION STORAGE
Information Patent Application
Method for preventing electromigration in an MRAM
- Publication number 20020001225
- Publication date Jan 3, 2002
- Peter Poechmueller
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated memory having memory cells with a magnetoresistive stora...
- Publication number 20020001224
- Publication date Jan 3, 2002
- Peter Poechmueller
- G11 - INFORMATION STORAGE

Peter Poechmueller

Person

Patents Grantslast 30 patents

Test data generator

Test circuit

Method for recognizing and replacing defective memory cells in a me...

Test circuit for testing a circuit

Integrated memory having memory cells with a magnetoresistive stora...

Integrated memory having memory cells with a magnetoresistive stora...

Patents Applicationslast 30 patents

Memory and method for replacing defective memory cells in the same

Test circuit for testing a synchronous circuit

Method for recognizing and replacing defective memory cells in a me...

Test circuit for testing a circuit

Test circuit

Test data generator

Integrated memory having memory cells with a magnetoresistive stora...

Method for preventing electromigration in an MRAM

Integrated memory having memory cells with a magnetoresistive stora...