Peter R. Robrish

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for recognizing patterns from assay results
- Patent number 7,705,976
- Issue date Apr 27, 2010
- Alverix, Inc.
- Peter R. Robrish
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz detection using a multi-mode signal
- Patent number 7,620,508
- Issue date Nov 17, 2009
- Agilent Technologies, Inc.
- Danielle R. Chamberlin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Liquid crystal cell that resists degradation from exposure to radia...
- Patent number 7,184,109
- Issue date Feb 27, 2007
- Agilent Technologies, Inc.
- Charles D. Hoke
- G02 - OPTICS
Information Patent Grant
Wafer-scale manufacturing method
- Patent number 6,921,676
- Issue date Jul 26, 2005
- Agilent Technologies, Inc.
- John P. Ertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polarization control device
- Patent number 6,686,984
- Issue date Feb 3, 2004
- Agilent Technologies, Inc.
- Charles Hoke
- G02 - OPTICS
Information Patent Grant
Total internal reflection optical switch utilizing a moving droplet
- Patent number 6,647,165
- Issue date Nov 11, 2003
- Agilent Technologies, Inc.
- Gongjian Hu
- G02 - OPTICS
Information Patent Grant
Polarization device
- Patent number 6,532,110
- Issue date Mar 11, 2003
- Agilent Technologies, Inc.
- Peter Robrish
- G02 - OPTICS
Information Patent Grant
Controllable optical attenuator
- Patent number 6,400,885
- Issue date Jun 4, 2002
- Agilent Technologies, Inc.
- Gongjian Hu
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Polarization-dependent imaging element
- Patent number 6,324,002
- Issue date Nov 27, 2001
- Agilent Technologies, Inc.
- Pierre H. Mertz
- G02 - OPTICS
Information Patent Grant
Reflective ferroelectric liquid crystal light valve with increased...
- Patent number 6,243,065
- Issue date Jun 5, 2001
- Agilent Technologies, Inc.
- Peter R. Robrish
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
Method for recognizing patterns from assay results
- Publication number 20070279620
- Publication date Dec 6, 2007
- Avago Technologies General IP (Singapore) PTE. LTD.
- Peter R. Robrish
- G01 - MEASURING TESTING
Information Patent Application
Non-optical reading of test zones
- Publication number 20060281193
- Publication date Dec 14, 2006
- John F. Petrilla
- G01 - MEASURING TESTING
Information Patent Application
Terahertz detection using a multi-mode signal
- Publication number 20060167641
- Publication date Jul 27, 2006
- Danielle R. Chamberlin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for reading an assay using low resolution dete...
- Publication number 20060142947
- Publication date Jun 29, 2006
- Peter Ronald Robrish
- G01 - MEASURING TESTING
Information Patent Application
Liquid crystal cell that resists degradation from exposure to radia...
- Publication number 20050128367
- Publication date Jun 16, 2005
- Charles D. Hoke
- G02 - OPTICS
Information Patent Application
Wafer-scale manufacturing method
- Publication number 20040191948
- Publication date Sep 30, 2004
- John P. Ertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Total internal reflection optical switch utilizing a moving droplet
- Publication number 20020181835
- Publication date Dec 5, 2002
- Gongjian Hu
- G02 - OPTICS

Peter R. Robrish

Person

Patents Grantslast 30 patents

Method for recognizing patterns from assay results

Terahertz detection using a multi-mode signal

Liquid crystal cell that resists degradation from exposure to radia...

Wafer-scale manufacturing method

Polarization control device

Total internal reflection optical switch utilizing a moving droplet

Polarization device

Controllable optical attenuator

Polarization-dependent imaging element

Reflective ferroelectric liquid crystal light valve with increased...

Patents Applicationslast 30 patents

Method for recognizing patterns from assay results

Non-optical reading of test zones

Terahertz detection using a multi-mode signal

Method and apparatus for reading an assay using low resolution dete...

Liquid crystal cell that resists degradation from exposure to radia...

Wafer-scale manufacturing method

Total internal reflection optical switch utilizing a moving droplet